Vacuum Probe Particle Manipulation for Precision Nanoparticle Relocation
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Solution Overview
Problem
Existing particle manipulation systems suffer from poor resolution, lack of accuracy and selectivity, particle contamination, and require extensive training, making it difficult to precisely detect, collect, and manipulate nano- and micrometer-scale particles without damaging or contaminating them.
Innovation Solution
A particle manipulation system comprising an optical imaging system, a processor, and a vacuum-based probe system that acquires images of mixed samples, identifies target particles, determines their lateral position, and uses a vacuum probe to collect and relocate particles without damaging or contaminating them, allowing for precise manipulation and deposition on a retrieval tray.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If existing particle manipulation systems are used, then particle collection can be performed, but resolution and precision are poor making it impossible to precisely detect and manipulate nano- and micrometer-scale particles
Solution Approach 1:
The system segments the particle manipulation task into distinct functional modules: optical imaging system for detection, processor for image analysis and target identification, and vacuum-based probe system for manipulation. This segmentation allows each module to be optimized for its specific function, enabling precise detection and manipulation of nano- and micrometer-scale particles
Solution Approach 2:
The patent replaces traditional mechanical manipulation methods with a vacuum-based probe system. The vacuum pump creates negative pressure to attract and hold particles on the probe tip, eliminating the need for physical contact and mechanical forces that could damage or displace delicate nano- and micrometer-scale particles
2Measurement precision
If existing particle manipulation systems are used, then particle collection is possible, but accuracy and selectivity are lacking making it difficult to locate and collect specific individual particles
Solution Approach 1:
The processor performs preliminary image analysis to identify and locate target particles before manipulation begins. The system pre-processes the optical image to determine the precise location and characteristics of particles of interest, allowing the vacuum probe to be positioned accurately and manipulate only the selected particles without requiring extensive operator training or intervention
Solution Approach 2:
The system uses real-time feedback from the optical imaging system and processor to guide the vacuum probe positioning and manipulation. The processor continuously analyzes particle positions and adjusts probe placement accordingly, enabling accurate selection and manipulation of specific particles while providing visual confirmation of the manipulation process
3Reliability
If existing particle manipulation systems are used, then particle collection can be performed, but particle contamination and damage occur due to crude probes and collection techniques
Solution Approach 1:
The vacuum-based probe system acts as an intermediary between the particle sample and the manipulation process. The vacuum field serves as a non-contact mediator that attracts and holds particles on the probe tip without physical contact, eliminating the harmful effects of mechanical forces, probe material contamination, and surface damage that occur with traditional contact-based manipulation methods
Solution Approach 2:
The patent replaces mechanical contact-based manipulation with vacuum-based non-contact manipulation. The vacuum pump creates a pressure differential that attracts particles to the probe tip and holds them there without physical contact, eliminating mechanical forces that could damage or contaminate delicate particles while maintaining reliable manipulation and relocation capability
4Ease of operation
If existing particle manipulation systems are used, then particle manipulation can be performed, but extensive training and experience are required to operate them
Solution Approach 1:
The processor performs self-service by automatically analyzing images, identifying target particles, determining their locations, and controlling the vacuum probe positioning and operation. This automation eliminates the need for operators to manually locate and manipulate particles, significantly reducing the training and experience required while maintaining precise control over the manipulation process
Solution Approach 2:
The integrated system combines multiple functions into a single platform: optical imaging for detection, image processing for analysis and identification, and vacuum-based manipulation for particle handling. This multi-functional integration allows a single operator to control all aspects of particle manipulation through one unified interface, reducing operational complexity and training requirements compared to separate specialized systems
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise identification, collection, and relocation of nano- and micrometer-scale particles with high accuracy, reducing contamination and training requirements, and facilitating sequential analyses and advanced material generation.
Implementation Method 1
a vacuum pump configured to apply a vacuum up through the probe. In operation, the processor may be further configured to instruct the vacuum-based probe system to move the moveable probe to the lateral position of the target particle; and initiate the vacuum pump to thereby apply a vacuum up through the probe such that the target particle is pulled away from the mixed sample of particles and held against the tip of the moveable probe
Data Source
AI summary
Systems and methods of manipulating nano- and micrometer scale particles are described. The system generally includes an optical imaging system for acquiring an image of a sample of particles, a processor for analyzing the image, identifying a target particle in the image, and determining the lateral position of the target particle in the sample of particles; and a vacuum-based probe system including a moveable probe and a vacuum pump configured to apply a vacuum up through the probe. The processor provides instructions for moving the probe to the lateral position of the target particle, and instructions to apply a vacuum up through the probe such that the target particle is pulled away from the sample of particles and held against the tip of the moveable probe. Once the probe collects and holds a target particle against the tip thereof, the probe can be moved to relocated the target particle to a precise new location, such as on to a particle retrieval tray.