Vacuum Retention for Inverted Microscope AFM Noise

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Solution Overview

Problem

Inverted microscopes with AFM modules experience high noise levels during scanning, particularly when using petri dishes, which limits the imaging speed and is undesirable for live samples, as conventional solutions either slow down scanning or require non-standard sample vessels.

Innovation Solution

A sample vessel retention mechanism with a vacuum region beneath the petri dish, barometrically coupled to a vacuum generator, isolates the dish's floor from acoustic excitation, reducing noise by increasing its resonant frequency beyond the operating bandwidth of the AFM probe's motion.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the AFM scanning speed is increased to improve imaging speed, then productivity is improved, but noise level increases and measurement precision deteriorates

Engineering Contradiction:
Improveimaging speedVSAvoidnoise level
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent applies mechanical vibration by using a vacuum retention mechanism to increase the resonant frequency of the petri dish floor. By coupling the petri dish to the microscope stage through vacuum, the system raises the resonant frequency above the AFM operating bandwidth, thereby reducing noise and enabling faster scanning speeds without sacrificing measurement precision.

Inventive Principle:
Principle #18Mechanical vibration

2Measurement precision

If a vacuum retention mechanism is implemented to reduce noise, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improvenoise reductionVSAvoidstructure complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The vacuum retention mechanism serves multiple functions: it secures the petri dish to the stage, isolates acoustic excitation from the dish floor, and raises the resonant frequency to reduce noise. By combining these functions into a single mechanism, the patent minimizes additional complexity while achieving significant noise reduction.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Measurement precision

If the resonant frequency of the petri dish floor is increased to reduce noise, then measurement precision is improved, but use of energy increases

Engineering Contradiction:
Improvenoise levelVSAvoidvacuum generation energy
Core Design Contradiction:
Measurement precisionVSUse of energy by moving object

Solution Approach 1:

The vacuum retention mechanism uses the vacuum itself to provide the isolation effect. Once the vacuum is established, the pressure differential automatically maintains the coupling between the petri dish and stage, and the resonant frequency elevation persists without additional energy input. The system essentially serves itself after initial activation.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution significantly reduces noise in AFM measurements, allowing for faster imaging without the need to replace standard petri dishes, thereby enhancing the utility of AFM instruments with inverted microscopes.

Implementation Method 1

a vacuum region having a boundary that includes a floor of the sample vessel and the surface of the platform, barometrically coupled with a vacuum generator to facilitate a working vacuum within that vacuum region

Methodology Applied
Scientific EffectVacuum: Vacuum

Implementation Method 2

the working vacuum causes the floor of the sample vessel to be substantially isolated from any acoustic excitation within the operating bandwidth resulting from the controlled motion of the SPM probe

Methodology Applied
Scientific EffectResonance: Resonance

Data Source

PatentUS10175263B2Sample vessel retention structure for scanning probe microscope
Publication Date: 2019.01.08 BRUKER NANO INC
  • US10175263B2 patent drawing
  • US10175263B2 patent drawing
  • US10175263B2 patent drawing

AI summary

A sample vessel retention mechanism for an inverted microscope having an optical objective and a scanning probe microscope (SPM) head. The inverted microscope includes a platform for supporting a sample vessel, in which is formed an aperture sized to provide a passage for the objective of the inverted microscope to approach the sample vessel from below. The retention mechanism provides a vacuum region formed in the platform, with the vacuum region being barometrically coupled with a vacuum generator. Establishment of a vacuum in the vacuum region prevents or substantially reduces oscillation of the sample vessel floor in an operating frequency range of the SPM head.