Vacuum Insulation Wrapping Film That Resists Bending Barrier Loss
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Solution Overview
Problem
Outer packing materials for vacuum insulation materials with metal aluminum films often fail to achieve sufficient water vapor barrier properties, and these properties degrade when the material is bent.
Innovation Solution
The outer packing material comprises a thermally weldable film and a gas barrier film with a metal aluminum film that satisfies specific intensity and thickness criteria, ensuring high crystallinity and film density, thereby maintaining excellent water vapor barrier properties even when bent.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a metal aluminum film is formed on the base material to provide water vapor barrier properties, then initial water vapor barrier properties are improved, but water vapor barrier properties degrade when the material is bent
Solution Approach 1:
The patent applies parameter changes by precisely controlling the thickness of the metal aluminum film (5-50 nm) and optimizing the vapor deposition conditions (temperature, pressure, deposition rate) to achieve the desired crystal orientation. By adjusting these parameters, the film achieves high (111) orientation which provides excellent resistance to bending-induced degradation while maintaining effective water vapor barrier properties.
Solution Approach 2:
The patent creates a composite structure by forming a metal aluminum film on a base material (such as polyethylene terephthalate or polypropylene). This composite combines the gas barrier properties of the metal aluminum film with the mechanical strength and flexibility of the polymer base material, resulting in a packaging material that maintains water vapor barrier properties even when bent.
2Reliability
If the metal aluminum film thickness is increased to improve water vapor barrier properties, then gas barrier performance is improved, but manufacturing cost and film brittleness increase
Solution Approach 1:
The patent optimizes the film thickness parameter to a specific range (5-50 nm) that balances gas barrier performance with manufacturing feasibility and film flexibility. Additionally, by controlling the vapor deposition parameters (temperature, pressure, deposition rate), the patent achieves high crystal orientation that enhances barrier properties without requiring excessive thickness, thereby reducing cost and maintaining flexibility.
Solution Approach 2:
The patent applies local quality by creating a thin metal aluminum film with specific crystal orientation characteristics rather than using a thick uniformly random film. The high (111) orientation provides enhanced barrier properties in the direction perpendicular to the film surface, achieving effective gas barrier performance with minimal thickness and reduced brittleness.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution provides excellent initial water vapor barrier properties and inhibits degradation due to bending, ensuring sustained thermal insulation performance.
Implementation Method 1
a gas barrier film including a base material and a metal aluminum film formed on one surface of the base material
Implementation Method 2
inside the bag body is kept in a vacuum state of which pressure is lower than the atmospheric pressure; thus, heat convection inside is suppressed
Data Source
Figure 1~2B

AI summary
The present disclosure provides a wrapping material for vacuum thermal insulation materials, which comprises a thermally weldable film and a gas barrier film, and wherein: the gas barrier film comprises a base material and an aluminum metal film that is formed on one surface of the base material; and the aluminum metal film satisfies formula (1) and formula (2). (1): 1.0 ∗ 10-3 ≤ (IA/IB) / T ≤ 3.5 ∗ 10-3 (2): (A/B) / T ≥ 3.8 ∗ 10-3 (In formula (1) and formula (2), IA represents the peak intensity (cps) of a diffraction peak that is positioned around 2θ = 38.5° in an X-ray diffraction measurement of the aluminum metal film with use of a CuKα ray; IB represents the peak intensity (cps) of a diffraction peak that is positioned around 2θ = 44.6° in an X-ray diffraction measurement of an aluminum metal foil with use of a CuKα ray; A represents the peak intensity (kcps) of elemental aluminum of the aluminum metal film as determined by X ray fluorescence analysis; B represents the peak intensity (kcps) of elemental aluminum of the aluminum metal foil as determined by X ray fluorescence analysis; and T represents the thickness (nm) of the aluminum metal film.