Valve Prognostics via Accelerated Aging Profiles
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Solution Overview
Problem
Existing process control systems face challenges in accurately predicting the lifespan of valves due to varying operating conditions, such as temperature, pressure, and fluid properties, which are difficult to simulate in laboratory tests, leading to incomplete and non-informative Mean Time To Failure (MTTF) and Mean Time Between Failure (MTBF) data.
Innovation Solution
A method is developed to create a projected lifetime profile for valve components by receiving operating parameter data and using previously-recorded performance data from reference components under compatible conditions, allowing for analysis of current operating conditions to determine a projected remaining lifetime and notify operators for maintenance scheduling.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional laboratory testing is used to determine MTTF and MTBF, then testing can be performed under controlled conditions, but the testing cannot accurately account for varied real operating conditions such as temperature, pressure, fluid properties, and contaminants
Solution Approach 1:
The patent applies parameter changes by systematically varying operating conditions (temperature, pressure, fluid properties, contaminants) in accelerated aging tests to create comprehensive lifetime profiles. Instead of testing under fixed conditions, the method changes multiple parameters simultaneously to simulate the full range of real-world operating environments, thereby resolving the contradiction between controlled testing and adaptability to varied conditions.
Solution Approach 2:
The patent implements dynamics by transitioning from static, fixed-condition laboratory testing to dynamic, multi-condition accelerated aging tests. The testing methodology dynamically adjusts operating parameters to match actual field conditions, allowing the system to adapt to varied temperature, pressure, and fluid conditions while maintaining controlled test environments. This dynamic approach enables accurate lifespan predictions across diverse operating scenarios.
2Loss of information
If historical service and repair data is collected to create MTTF and MTBF, then predictive data can be generated, but the data is often incomplete or non-existent due to maintenance record limitations and customer privacy concerns
Solution Approach 1:
The patent applies preliminary action by performing accelerated aging tests during the product development and manufacturing phase, before products are deployed to customers. This preliminary testing generates comprehensive MTTF and MTBF data without requiring collection of historical failure data from field operations. By proactively gathering reliability data through controlled accelerated tests, the method eliminates the need for customers to share sensitive operational data while still providing accurate predictive information.
3Measurement precision
If laboratory cycle testing is performed under conditions approximating real life conditions, then effective lifespan data can be obtained, but fluid properties and contaminations are difficult to simulate accurately
Solution Approach 1:
The patent applies segmentation by dividing the complex task of simulating real-world conditions into separate, manageable accelerated aging test components. Each test targets specific failure mechanisms (oxidation, thermal aging, pressure cycling, contaminant exposure) individually. By segmenting the comprehensive reliability assessment into discrete test modules, the method achieves high measurement precision for each failure mode while avoiding the complexity of simultaneously simulating all real-world conditions in a single test setup.
Data Source
AI summary
The claimed method and system develops accelerated aging test protocols for a component of a process control device, such as a polymeric component of a valve assembly, where the accelerated aging test protocol is specifically developed in response to expected operating conditions to be used during operation of the process control device in a process plant installation. Test data from the developed accelerated aging tests is analyzed to determine a projected lifetime profile of the component that profiles the component through failure under those expected operating conditions. Particular profiling for polymeric features includes oxidation failure profiling and other fatigue conditions.