Vaporization Adjusting Plate for Uniform DCR Vaporization
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Solution Overview
Problem
In multi-tray vaporization devices used for semiconductor manufacturing, there is a tendency for dodecacarbonyl triruthenium (DCR) to vaporize unevenly, leading to reduced surface area exposure to the carrier gas, decreased partial pressure, and subsequently lower formation efficiency of the ruthenium barrier layer.
Innovation Solution
A vaporization amount adjusting plate with varying aperture ratios per unit area is used to cover the solid raw material, ensuring uniform vaporization from the outer circumferential side to the exhaust passage side, preventing bias and maintaining the surface area exposed to the carrier gas, thereby stabilizing the partial pressure of DCR in the carrier gas.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If a multi-tray vaporization device is used for thermal decomposition of DCR, then the ruthenium barrier layer can be formed on the wafer, but the DCR vaporizes unevenly causing reduced surface area exposure and decreased partial pressure
Solution Approach 1:
The vaporization amount adjusting plate is divided into multiple regions with different aperture ratios to create local quality variations. The aperture ratio is set to be smaller in regions where DCR vaporizes more actively and larger in regions where vaporization is slower, thereby achieving uniform vaporization across the entire DCR surface by compensating for local differences in vaporization rates.
2Quantity of substance
If the carrier gas flows from the outer peripheral side toward the exhaust passage, then the vaporized DCR is entrained and transported, but the surface area of DCR exposed to carrier gas decreases over time
Solution Approach 1:
The vaporization amount adjusting plate is placed on the DCR surface before the vaporization process begins and is maintained throughout the process. This preliminary placement ensures that the carrier gas flows uniformly across the entire DCR surface from the beginning, preventing the formation of dead zones and ensuring consistent exposure of the DCR surface to the carrier gas throughout the vaporization process.
3Device complexity
If the aperture ratio is uniform across the vaporization amount adjusting plate, then the structure is simple, but the vaporization becomes biased toward the exhaust passage side
Solution Approach 1:
The vaporization amount adjusting plate is divided into multiple regions with different aperture ratios to create local quality variations. The aperture ratio is set to be smaller in regions where DCR vaporizes more actively and larger in regions where vaporization is slower, thereby achieving uniform vaporization across the entire DCR surface by compensating for local differences in vaporization rates.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach prevents the decrease in vaporized DCR entrained by the carrier gas, maintaining the partial pressure and enhancing the formation efficiency of the ruthenium barrier layer during the semiconductor manufacturing process.
Implementation Method 1
the carrier gas is vaporized from the solid raw material and carries a predetermined raw material that has passed through the plurality of through holes
Implementation Method 2
the carrier gas entrains the vaporized DCR, passes through the exhaust passage, and flows into the processing container
Implementation Method 3
a barrier layer made of Ru is produced by thermally decomposing a solid raw material containing Ru, such as dodecacarbonyl triruthenium (DCR)
Implementation Method 4
in a thermal chemical vapor deposition (TCVD), a barrier layer made of Ru is produced by thermally decomposing a solid raw material containing Ru
Data Source
AI summary
A vaporization device includes a vaporization amount adjusting plate that covers a surface of a solid raw material, and an exhaust passage that exhausts a carrier gas that flows while being faced with the vaporization amount adjusting plate. The vaporization amount adjusting plate has a plurality of through holes. An aperture ratio per unit area in the adjusting plate varies along a flowing direction of the carrier gas. The carrier gas is vaporized from the solid raw material and carries a predetermined raw material that has passed through the plurality of through holes.


