Variable Interval Probe Block for Display Inspection
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Solution Overview
Problem
The existing inspection devices for display devices face increased manufacturing costs and reduced efficiency due to the need for redesigning and manufacturing multiple probe types when the number of signal channels exceeds the number of pads or when pad layouts vary, leading to inefficiencies in the inspection process.
Innovation Solution
The implementation of a variable interval probe block system with first and second probe blocks, each with probes matching the pad groups' layouts, connected by a signal source with fewer channels, allowing for adjustable positioning and common signal supply to pads, reducing the need for multiple probe types and improving adaptability across different display device specifications.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the number of signal source channels exceeds the total number of pads or the total number of probes, then the inspection can be performed with sufficient signal coverage, but the manufacturing costs increase and the device complexity increases
Solution Approach 1:
The probe block is designed with universal applicability to accommodate multiple pad configurations. The probe block can be used with different numbers of pads (e.g., 24 pads or 36 pads) without requiring redesign, as the signal source can dynamically allocate its channels to match the actual pad configuration. This multi-functionality allows a single probe block design to serve multiple inspection scenarios.
Solution Approach 2:
The system changes the operational parameters of the signal source by dynamically adjusting the number of active channels based on the pad configuration. The signal source can operate with different channel allocations (e.g., using 24 channels for a 24-pad configuration or 36 channels for a 36-pad configuration), allowing the same hardware to adapt to different inspection requirements without physical modification.
2Adaptability or versatility
If the pad layout or pitch is varied according to product specifications, then the inspection device can accommodate different display device specifications, but the probes need to be redesigned and manufactured again, increasing manufacturing costs
Solution Approach 1:
The probe block is designed as a universal component that can interface with different pad layouts and pitch configurations. Rather than creating specialized probe blocks for each pad configuration, the same probe block design can be used across multiple product specifications. The adaptability is achieved through the flexible signal source that can reconfigure channel assignments to match different physical pad arrangements.
Solution Approach 2:
The system introduces dynamic reconfiguration capability where the signal source can change its operational state based on the detected pad configuration. The probe block maintains a fixed physical structure, but the electrical connection pattern is dynamically adjusted through software control of the signal source channels, allowing adaptation to different pad pitches and layouts without physical probe changes.
3Manufacturing precision
If multiple types of probes are designed and manufactured for different pad configurations, then each configuration can be inspected with optimized probes, but the inspection efficiency decreases due to frequent redesign and manufacturing cycles
Solution Approach 1:
A single probe block design serves multiple inspection purposes across different display device specifications. The universal probe block eliminates the need to manufacture multiple specialized probe types, thereby maintaining inspection accuracy through consistent probe design while dramatically improving productivity by eliminating repeated design and manufacturing cycles.
4Ease of manufacture
If the probe block position is fixed, then the manufacturing process is simplified, but the device cannot accommodate varying pad intervals across different product specifications
Solution Approach 1:
The probe block attachment mechanism incorporates dynamic positioning capability, allowing the probe block to be adjusted to different positions along the display device substrate. This dynamic adjustment enables the same probe block to accommodate varying pad intervals and layouts while maintaining simplified manufacturing of the probe block itself, as the physical structure remains unchanged and only the positioning varies.
Data Source
AI summary
According to one embodiment, an inspection device of a display device, includes a first probe block which includes first probes, a probe block attachment which supports the first probe block to enable a position of the first probe block to be set variably, a signal source which supplies a signal to the first probes, and a transmission cable which connects the first probe block with the signal source.