Variable Transistor Load Circuit for High-Voltage Power Supply Testing
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Solution Overview
Problem
High voltage power supplies in nuclear instrumentation systems are difficult to test effectively due to their complex circuit design and the need for high-voltage-rated discrete resistors, which cannot adequately simulate all loading conditions, leading to potential performance instabilities and safety issues.
Innovation Solution
A continuously variable electronic load tester using a series connection of transistors as variable resistors, controlled by a control circuit to provide a continuous range of load testing at varying resistances, reducing complexity and cost while ensuring reliable performance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If high-voltage-rated discrete resistors are used for loading conditions, then the power supply can be tested, but the device complexity and cost increase significantly
Solution Approach 1:
The patent replaces the mechanical/discrete resistor approach with an electronic field-effect transistor-based variable load circuit. The FETs operate in the linear region to provide continuous variable resistance control, eliminating the need for discrete high-voltage resistors and reducing overall circuit complexity while maintaining testing reliability.
Solution Approach 2:
The patent utilizes the linear region operation of field-effect transistors to achieve continuous parameter variation in resistance. By controlling the gate voltage of the FETs, the load resistance can be continuously adjusted through a wide range, providing comprehensive loading conditions without requiring multiple discrete resistor components.
2Reliability
If discrete high-voltage resistors are used, then load testing is possible, but manufacturing cost and component availability issues arise
Solution Approach 1:
The patent substitutes discrete high-voltage resistor components with integrated field-effect transistor circuits that can be manufactured using standard semiconductor fabrication processes. This approach eliminates the need for specialized high-voltage resistor components, improving ease of manufacture and reducing costs.
Solution Approach 2:
The FET-based variable load circuit serves multiple functions: it provides continuous variable resistance control, handles high voltage testing, and can be implemented using standard electronic components. This multi-functionality eliminates the need for separate discrete high-voltage resistors and simplifies the overall system.
3Reliability
If fixed discrete resistors are used for testing, then specific load conditions can be tested, but the ability to simulate all loading conditions is limited
Solution Approach 1:
The patent employs dynamic control of field-effect transistor gates to achieve continuous variable resistance adjustment. This dynamic operation allows the load to be adjusted to any required value within the operating range, enabling comprehensive simulation of all possible loading conditions rather than being limited to fixed discrete resistor values.
Solution Approach 2:
The patent utilizes continuous parameter variation through FET gate voltage control to achieve a continuous range of load resistance values. This continuous parameter adjustment capability allows the system to simulate any loading condition from light to heavy load, providing comprehensive testing coverage.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution allows for comprehensive testing of high voltage power supplies by simulating a wide range of load conditions, improving reliability and safety by reducing the need for high-voltage-rated discrete resistors and minimizing design complexity.
Implementation Method 1
The variable electronic load circuit comprises a plurality of transistors connected in series and operable as variable resistors
Implementation Method 2
The control circuit comprises an error amplifier to compare a first voltage to a feedback signal and an output signal indicative of a difference between the first voltage and the feedback signal
Data Source
AI summary
A variable electronic load tester circuit comprising a control circuit and a variable electronic load circuit coupled to the control circuit to receive a voltage from a power supply and present a load to the power supply. The variable electronic load circuit comprises a plurality of transistors connected in series and operable as variable resistors. The control circuit is to control a resistance of the variable resistors to control the load presented to the power supply. The control circuit comprises an error amplifier to compare a first voltage to a feedback signal and an output signal indicative of a difference between the first voltage and the feedback signal. The output signal is to control the resistance of the variable electronic load circuit to vary the load presented to the power supply. The feedback signal is proportional to a current flowing through the variable electronic load circuit.