Variable Electronic Load Circuit for High-Voltage Power Supply Testing
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Solution Overview
Problem
High voltage power supplies in nuclear instrumentation systems are difficult to test effectively due to their complex circuit design and the need for high-voltage-rated discrete resistors, which cannot adequately simulate all loading conditions, leading to potential operational instabilities and degradation.
Innovation Solution
A continuously variable electronic load tester using a series connection of transistors as variable resistors, controlled by a control circuit with an error amplifier to match a feedback signal, allowing for a continuous range of load testing at varying resistances.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If discrete high-voltage-rated resistors are used for loading, then the power supply can be tested, but the testing is limited and cannot simulate all loading conditions
Solution Approach 1:
The patent employs a dynamic electronic load circuit using transistors as variable resistors, allowing continuous adjustment of load resistance. This dynamic approach enables the tester to simulate any loading condition from open circuit to short circuit, transforming a static testing setup into a versatile, adaptive system that can accommodate all possible load scenarios.
Solution Approach 2:
The patent replaces the mechanical/discrete resistor approach with an electronic control system. Instead of using physical high-voltage resistors, the invention uses transistor-based electronic switching and resistance control, enabling continuous variable loading through electronic means rather than discrete mechanical components.
2Reliability
If high-voltage-rated discrete resistors are used, then testing can be performed, but design complexity and cost increase
Solution Approach 1:
The patent segments the high-voltage testing function into multiple lower-voltage transistor stages connected in series. Each transistor handles a portion of the total voltage, allowing the use of standard, reliable transistor components instead of single high-voltage resistors. This segmentation maintains reliability while reducing individual component stress and design complexity.
Solution Approach 2:
The patent changes the resistance parameter continuously through transistor gate voltage control. By varying the gate voltage of the transistors, the load resistance can be adjusted from very high to very low values, providing comprehensive testing coverage without requiring discrete high-voltage resistors for each testing condition.
3Adaptability or versatility
If fixed resistance values are used for testing, then simple equipment can be used, but comprehensive testing of all loading conditions is not possible
Solution Approach 1:
The patent creates a universal testing device where a single electronic load circuit can perform multiple testing functions by adjusting transistor gate voltages. The same circuit can simulate any loading condition from light load to heavy load, making the equipment multi-functional and eliminating the need for multiple specialized test rigs.
Solution Approach 2:
The patent incorporates feedback control through the error amplifier that monitors the actual load conditions and adjusts transistor gate voltages accordingly. This feedback mechanism enables automatic adaptation to different loading conditions, ensuring accurate and comprehensive testing while maintaining simple equipment architecture.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables comprehensive testing of high voltage power supplies by simulating a wide range of load conditions, reducing design complexity and cost while ensuring reliability and safety.
Implementation Method 1
The control circuit comprises an error amplifier to compare a first voltage to a feedback signal and an output signal indicative of a difference between the first voltage and the feedback signal
Implementation Method 2
The variable electronic load circuit comprises a plurality of transistors connected in series and operable as variable resistors
Data Source
AI summary
A variable electronic load tester circuit comprising a control circuit and a variable electronic load circuit coupled to the control circuit to receive a voltage from a power supply and present a load to the power supply. The variable electronic load circuit comprises a plurality of transistors connected in series and operable as variable resistors. The control circuit is to control a resistance of the variable resistors to control the load presented to the power supply. The control circuit comprises an error amplifier to compare a first voltage to a feedback signal and an output signal indicative of a difference between the first voltage and the feedback signal. The output signal is to control the resistance of the variable electronic load circuit to vary the load presented to the power supply. The feedback signal is proportional to a current flowing through the variable electronic load circuit.