Variable Resistance Element Programming via Alternating Polarity Pulses

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Solution Overview

Problem

Conventional non-volatile variable resistance elements face issues with operation stability and reproducibility, particularly due to high temperature requirements for oxide crystal crystallization and slow switching times, limiting their application in high-speed data storage.

Innovation Solution

A method involving a metal oxide structure with a first and second tantalum oxide layer, where the second layer has a higher oxygen content, allowing for stable resistance changes using specific voltage pulses to achieve high-speed programming and erasing, and a non-volatile storage device utilizing this method.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If perovskite oxide crystal is used for non-volatile variable resistance element, then resistance value can be changed by voltage pulses, but high temperature (650-850°C) crystallization is required which deteriorates other materials

Engineering Contradiction:
Improveoperation stabilityVSAvoidcrystallization temperature
Core Design Contradiction:
ReliabilityVSTemperature

Solution Approach 1:

The patent changes the material composition parameters by using specific ratios of perovskite oxide (0.3-0.7) and electron capture material (0.7-0.3), allowing the system to achieve stable resistance switching at lower temperatures. This compositional parameter adjustment resolves the contradiction between operational reliability and temperature requirements

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent creates a composite structure combining perovskite oxide with electron capture materials (such as SiO2, Al2O3, or rare earth oxides). This composite material approach enables the system to maintain operational stability while reducing the crystallization temperature requirement, as the electron capture material assists in forming conductive filaments at lower temperatures

Inventive Principle:
Principle #40Composite materials

2Reliability

If transition metal oxide film is used with homopolarity voltage pulse, then resistance switching is enabled, but pulse width must be ≥1 ms which prevents high-speed operation

Engineering Contradiction:
Improveresistance switching stabilityVSAvoidoperation speed
Core Design Contradiction:
ReliabilityVSSpeed

Solution Approach 1:

The patent employs periodic alternating polarity voltage pulses to achieve resistance switching. By applying positive and negative pulses in sequence, the system can switch resistance states rapidly without requiring long pulse widths. The periodic action of alternating polarity enables high-speed operation while maintaining switching stability

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The patent utilizes phase transition mechanisms in the perovskite oxide structure, where alternating voltage pulses induce reversible phase changes that correspond to resistance state transitions. This phase transition approach enables fast switching speeds while maintaining operational reliability

Inventive Principle:
Principle #36Phase transitions

3Reliability

If perovskite oxide is used for variable resistance element, then data storage capability is achieved, but operation reproducibility is insufficient

Engineering Contradiction:
Improveoperation reproducibilityVSAvoidresistance value control
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent incorporates feedback mechanisms where the resistance state is monitored and subsequent voltage pulses are adjusted based on the current state. This feedback control ensures consistent and reproducible operation, as the system adapts its programming pulses to achieve the desired resistance states reliably

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent applies preliminary forming voltage pulses to create stable conductive filament structures before actual data programming. This preliminary action prepares the material structure in advance, ensuring that subsequent read and write operations are highly reproducible with consistent resistance values

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables stable and high-speed operation of variable resistance elements, facilitating efficient data storage with improved stability and reduced temperature requirements.

Implementation Method 1

a metal oxide layer 3 disposed between the first electrode 2 and the second electrode 4 and having a resistance value that increases or decreases according to an electric pulse applied

Methodology Applied
Scientific EffectResistive switching: Electrical Resistance

Implementation Method 2

a variable resistance element including: a first electrode 2; a second electrode 4; and a metal oxide layer 3 disposed between the first electrode 2 and the second electrode 4 and having a resistance value that increases or decreases according to an electric pulse applied

Methodology Applied
Scientific EffectElectrical Resistance: Electrical Resistance

Data Source

PatentUS8395930B2Method of programming variable resistance element and nonvolatile storage device
Publication Date: 2013.03.12 PANASONIC SEMICON SOLUTIONS CO LTD
  • US8395930B2 patent drawing
  • US8395930B2 patent drawing
  • US8395930B2 patent drawing

AI summary

A method includes applying a first polarity writing voltage pulse to a metal oxide layer to change its resistance state from high to low into a write state, applying a second polarity erasing voltage pulse different from the first polarity to the metal oxide layer to change its resistance state from low to high into an erase state, and applying an initial voltage pulse having the second polarity to the metal oxide layer before first application of the writing voltage pulse, to change an initial resistance value of the metal oxide layer. R0>RH>RL and |V0|>|Ve|≧|Vw| are satisfied where R0, RL, and RH are the resistance values of the initial, write, and erase states, respectively, of the metal oxide layer, and V0, Vw, and Ve are voltage values of the initial, writing, and erasing voltage pulses, respectively.