Variable Speed Probe Inspection for Fine Electrode Terminals
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Solution Overview
Problem
Conventional mobile contact inspection apparatuses have constant action speed for movable axes, leading to increased inspection time with more measurement points and compromised accuracy when probing fine electrode terminals.
Innovation Solution
An inspection apparatus and method that adjust the action speed of movable axis drive units based on size information of electrode terminals to optimize positioning and reduce inspection time while maintaining accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the action speed of movable axes is increased, then inspection time is reduced, but positioning accuracy of probes is deteriorated
Solution Approach 1:
The patent applies dynamics by making the action speed of movable axes variable rather than constant. The drive control unit dynamically adjusts the action speed based on the size of electrode terminals, allowing high speed for large terminals and low speed for fine terminals. This resolves the contradiction by adapting the speed to the specific inspection requirements of each measurement point.
Solution Approach 2:
The patent changes the parameter of action speed from a fixed constant to a variable parameter that depends on electrode terminal size. The drive control unit receives size information and adjusts the action speed parameter accordingly, enabling faster inspection for large terminals while maintaining positioning accuracy for fine terminals through reduced speed.
2Reliability
If the number of measurement points is increased, then inspection coverage is improved, but inspection time becomes longer
Solution Approach 1:
The patent applies local quality by differentiating the inspection process based on the local characteristics of electrode terminals. Instead of using a uniform action speed for all measurement points, the system adjusts the action speed locally according to the size of each electrode terminal. This allows efficient inspection of large terminals while maintaining precision for fine terminals, reducing overall inspection time for comprehensive coverage.
Data Source
AI summary
To reduce inspection time by changing an action speed of a movable axis movable part while considering size information of an electrode terminal as a contact destination of a probe. An inspection apparatus of the present disclosure is an inspection apparatus with a plurality of movable probes that brings each of the movable probes into contact with each of a plurality of objects to be inspected on a board to be inspected so as to measure electrical characteristics between the objects to be inspected. The inspection apparatus includes a plurality of movable parts that support the movable probes, move the movable probes in a plurality of axis directions, and position the movable probes at positions of the objects to be inspected so that the movable probes are in contact with the objects to be inspected, a drive unit that drives the movable parts moving the movable probes, and a drive control unit that controls an action speed of the movable parts moving the movable probes in accordance with size information of the objects to be inspected as next contact destinations of the movable probes.