Variable Temperature Test Platform for Accurate Multi-Zone Memory Testing
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Solution Overview
Problem
Conventional test methods for rewritable non-volatile memory modules require multiple test equipment under different temperature environments, leading to reduced accuracy, prolonged test times, and increased costs due to plug swap tests.
Innovation Solution
A variable temperature test system with a main control device, test devices, and a variable temperature test platform that adjusts temperatures according to test requirements, ensuring accurate temperature matching with actual applications, and avoids plug swap tests.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple test equipment under different temperature environments are used to conduct plug swap tests, then different temperature environments can be provided, but test accuracy is reduced, test time is prolonged, and test costs increase
Solution Approach 1:
The patent combines multiple temperature environment capabilities into a single test platform by integrating a temperature control chamber that can provide different temperature environments (e.g., high temperature, low temperature, room temperature) within one unified test system. This eliminates the need for multiple separate test equipment while maintaining the ability to conduct tests under various temperature conditions, thereby preserving test accuracy and reducing test complexity
Solution Approach 2:
The test platform is designed with multi-functionality to perform different types of tests (plug swap tests, temperature cycle tests, reliability tests) under various temperature environments using a single unified system. The temperature control chamber can be adjusted to provide different temperature settings, making the test platform universal and adaptable to multiple test requirements without sacrificing measurement precision
2Adaptability or versatility
If multiple test equipment under different temperature environments are used to conduct plug swap tests, then different temperature environments can be provided, but test time is prolonged
Solution Approach 1:
By merging multiple temperature environment capabilities into one test platform, the patent eliminates the time required to physically move test equipment or components between different temperature chambers. The single platform can maintain multiple temperature zones simultaneously or quickly switch between temperatures, significantly reducing test time while still providing the necessary temperature environment adaptability
Solution Approach 2:
The temperature control chamber is pre-configured with multiple temperature zones and control systems that can be set up in advance. This preliminary preparation allows tests to begin immediately without the delays associated with setting up multiple separate equipment systems, thereby reducing overall test time while maintaining temperature environment versatility
3Adaptability or versatility
If multiple test equipment under different temperature environments are used to conduct plug swap tests, then different temperature environments can be provided, but test costs increase
Solution Approach 1:
The patent merges the functionality of multiple test equipment into a single integrated test platform with a unified temperature control chamber. This consolidation reduces the quantity of equipment needed while maintaining the ability to provide different temperature environments, thereby reducing equipment costs, space requirements, and maintenance expenses
Solution Approach 2:
The test platform is designed as a universal system that can perform multiple test types under various temperature conditions using a single equipment set. This multi-functionality eliminates the need to purchase and maintain multiple specialized equipment systems, reducing overall test costs while preserving temperature environment adaptability
4Measurement precision
If a variable temperature test platform is used to dynamically adjust temperatures, then test accuracy is improved, but device complexity increases
Solution Approach 1:
The patent implements dynamic temperature adjustment through a temperature control chamber that can change temperature parameters (temperature level, humidity) based on test requirements. This allows the system to accurately simulate real-world temperature conditions, improving test accuracy. The complexity is managed through automated control systems that regulate temperature changes without requiring complex manual intervention
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Improves test accuracy by dynamically adjusting temperatures to match real-world conditions, reduces component loss, and saves test time and costs by eliminating the need for multiple equipment swaps.
Implementation Method 1
The temperature control module is coupled to the test areas. The temperature control module controls a temperature of at least one test area according to the adjustment parameter
Implementation Method 2
The variable temperature test platform includes multiple test areas, multiple temperature sensors, and a temperature control module
Implementation Method 3
the variable temperature test platform further includes a heat insulation area. The heat insulation area is disposed between the test areas to insulate heat conduction between the test areas
Data Source
AI summary
A variable temperature test system and an operation method thereof are provided. The variable temperature test system includes a main control device, multiple test devices, and a variable temperature test platform. The variable temperature test platform is coupled to the main control device and the test devices. The main control device provides an adjustment parameter according to at least one pending test. The variable temperature test platform includes multiple test areas, multiple temperature sensors, and a temperature control module. The test areas are respectively coupled to the test devices. The temperature sensors are respectively disposed in the test areas. The temperature control module is coupled to the test areas. The temperature control module adjusts a temperature of at least one test area according to the adjustment parameter.