Strain-creating Element with Varying Composition for Transistor Mobility

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Solution Overview

Problem

The reduction of channel length in field effect transistors leads to strain relaxation in strain-creating elements, resulting in reduced mobility of charge carriers in the channel region, which affects the performance of the transistors.

Innovation Solution

Forming strain-creating elements with a varying chemical composition, where the concentration ratio of the first and second chemical elements changes across different portions, reducing strain gradients and minimizing crystal defects, thereby maintaining strain and enhancing carrier mobility.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the channel length is reduced to increase the number of circuit elements and improve speed, then the transistor density and operation speed are improved, but the strain in strain-creating elements relaxes leading to reduced charge carrier mobility

Engineering Contradiction:
Improvetransistor densityVSAvoidcharge carrier mobility
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The strain-creating element is designed with a non-uniform composition distribution, where the concentration of the second material varies across different regions of the element. This local variation in composition creates different strain characteristics in different portions of the element, allowing the strain to be maintained effectively even in reduced channel length transistors.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The invention changes the compositional parameter of the strain-creating element by incorporating a gradient or varying concentration of the second material. This parameter change allows the strain-creating element to maintain effective strain in shorter channel lengths where conventional uniform composition elements would relax.

Inventive Principle:
Principle #35Parameter changes

2Adaptability or versatility

If the channel length is reduced to enhance functionality, then the number of functional elements increases, but highly sophisticated dopant profiles and advanced photolithography techniques are required

Engineering Contradiction:
Improvecircuit functionalityVSAvoidmanufacturing process complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

By implementing a strain-creating element with non-uniform composition, the invention provides a localized strain enhancement that works effectively with reduced channel lengths without requiring complex dopant profiles or advanced photolithography techniques.

Inventive Principle:
Principle #3Local quality

3Productivity

If the width of the channel region is reduced to increase transistor density, then the transistor density is improved, but the channel conductivity decreases

Engineering Contradiction:
Improvetransistor densityVSAvoidchannel conductivity
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The non-uniform composition distribution in the strain-creating element provides localized strain enhancement in the channel region, compensating for the reduced channel width and maintaining channel conductivity despite higher transistor density.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach maintains strain in the channel region, increasing the mobility of holes and electrons, and reducing the likelihood of crystal defects, thus improving the performance of field effect transistors.

Implementation Method 1

the lattice structure in the channel region may be modified by creating tensile or compressive strain. This leads to a modified mobility of electrons and holes, respectively.

Methodology Applied
Scientific EffectStrain: Deformation

Data Source

PatentUS7629211B2Field effect transistor and method of forming a field effect transistor
Publication Date: 2009.12.08 OCEAN SEMICON LLC
  • US7629211B2 patent drawing
  • US7629211B2 patent drawing
  • US7629211B2 patent drawing

AI summary

A method of forming a field effect transistor comprises providing a semiconductor substrate, a gate electrode being formed over the semiconductor substrate. At least one cavity is formed adjacent the gate electrode. A strain-creating element is formed in the at least one cavity. The strain-creating element comprises a compound material comprising a first chemical element and a second chemical element. A first concentration ratio between a concentration of the first chemical element in a first portion of the strain-creating element and a concentration of the second chemical element in the first portion of the strain-creating element is different from a second concentration ratio between a concentration of the first chemical element in a second portion of the strain-creating element and a concentration of the second chemical element in the second strain-creating element.