VCC Trip Point Capture Circuit for Faster IC Test Debug
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Solution Overview
Problem
Existing electronic circuitry lacks an efficient method to determine the voltage trip point of a power supply signal for testing, characterization, and debugging purposes, especially in integrated circuits like flash memory, where precise measurement is crucial but often time-consuming and environmentally dependent.
Innovation Solution
An integrated circuit with a comparison circuit that trips based on a power supply signal reaching a trip point, coupled with an analog-to-digital converter to convert the signal into a digital value, a storage component to store this value, and a latch to ensure the digital value is maintained when the comparison circuit trips, allowing for accurate output at an output pin.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional silicon probing methods are used to measure power supply trip point, then measurement can be performed, but the process is time-consuming and environmentally dependent
Solution Approach 1:
The patent replaces the mechanical silicon probing method with an integrated electronic measurement system. The circuit uses an analog-to-digital converter to convert the power supply voltage signal into a digital value that can be directly read through standard I/O pins, eliminating the need for physical probing and environmental setup.
Solution Approach 2:
The integrated circuit performs self-measurement of its own power supply trip point. The comparison circuit monitors the power supply voltage internally, and when the trip point is reached, the latch captures and stores the digital value for later retrieval, allowing the device to characterize itself without external testing equipment.
2Reliability
If integrated circuit testing is performed with environmental dependencies, then measurement can be conducted, but reliability varies across conditions
Solution Approach 1:
The patent eliminates environmental dependencies by replacing physical probing methods with an integrated electronic measurement system that operates independently of external conditions. The measurement is performed internally within the circuit, making it insensitive to environmental variations.
Solution Approach 2:
The measurement system is integrated into the standard I/O architecture of the integrated circuit, allowing the same pins used for normal operation to also serve for trip point measurement. This universal approach works across different operating conditions and environments without requiring specialized testing setups.
3Measurement precision
If detailed trip point characterization is performed, then debugging accuracy improves, but testing complexity increases
Solution Approach 1:
The patent combines the trip point measurement functionality with the existing I/O architecture of the integrated circuit. The comparison circuit, analog-to-digital converter, and latch are integrated alongside the standard digital output pins, allowing detailed trip point characterization to be achieved through the same interface used for normal digital operations.
Solution Approach 2:
The patent creates a digital copy of the power supply voltage signal through the analog-to-digital converter. This digital representation accurately replicates the analog trip point information in a form that can be easily processed and analyzed, providing detailed characterization without requiring complex analog measurement equipment.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate and efficient measurement of the power supply trip point without the need for silicon probing, speeding up debugging and characterization processes by providing a digital representation of the power supply voltage, thus facilitating faster and more reliable testing across varying conditions.
Implementation Method 1
a comparison circuit which is arranged to trip based on a power supply signal, <VCC>, reaching a trip point
Implementation Method 2
an analog-to-digital converter which is arranged to convert the power supply signal into a digital signal, having a digital value based on a voltage associated with the power supply signal
Implementation Method 3
a latch which is arranged to open when the comparison circuit trips, such that, when the comparison circuit trips, the storage component continues to store a digital value
Data Source
AI summary
An apparatus and method for testing is provided. An integrated circuit includes a comparison circuit that is arranged to trip based on a power supply signal reaching a trip point. The integrated circuit also includes an analog-to-digital converter that is arranged to convert the power supply signal into a digital signal. The integrated circuit also includes a storage component that stores a digital value associated with the digital signal, and provides the power supply value at an output pin of the integrated circuit. The integrated circuit includes a latch that is coupled between the analog-to-digital converter and the storage component. The latch is arranged to open when the comparison circuit trips, such that, when the comparison circuit trips, the storage component continues to store a digital value such that the digital value corresponds to the voltage associated with the power supply signal when the comparison circuit tripped.