Single-Pixel Imaging Speed via VCSEL Array Segmentation

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Solution Overview

Problem

Existing single-pixel imaging techniques face challenges in achieving high-speed image acquisition due to the limited switching speed of spatial modulation elements, which restricts the repetition frequency of mask patterns and results in inefficient mask pattern irradiation.

Innovation Solution

The use of a light source with multiple emission points, such as a VCSEL array, allows for high-speed switching of mask patterns by superimposing light emission pattern switching on the modulation of a spatial modulation element, effectively increasing the speed of mask pattern irradiation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a spatial modulation element is used to generate mask patterns, then image information can be acquired through single-pixel imaging, but the switching speed of the spatial modulation element limits the repetition frequency of mask patterns and reduces imaging speed

Engineering Contradiction:
Improveimage information acquisitionVSAvoidmask pattern switching speed
Core Design Contradiction:
Measurement precisionVSSpeed

Solution Approach 1:

The light source is segmented into multiple independent light emission points (e.g., VCSEL array with multiple elements). Each light emission point can be controlled independently to generate mask patterns, replacing the single spatial modulation element. This segmentation enables parallel generation of multiple mask patterns, significantly increasing the repetition frequency and imaging speed while maintaining measurement precision.

Inventive Principle:
Principle #1Segmentation

2Loss of information

If mask patterns are irradiated sequentially through a single spatial modulation element, then correlation calculation can be performed to reconstruct images, but the time required to obtain image information is excessive

Engineering Contradiction:
Improveimage information completenessVSAvoidimage acquisition time
Core Design Contradiction:
Loss of informationVSLoss of time

Solution Approach 1:

Multiple light emission points operate in parallel to continuously generate and irradiate different mask patterns without sequential switching delays. The simultaneous operation of multiple light sources maintains continuous useful action, eliminating idle time between mask pattern presentations and significantly reducing total image acquisition time while preserving complete image information through correlation calculation.

Inventive Principle:
Principle #20Continuity of useful action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach significantly enhances the input speed of single-pixel imaging by reducing the time required to obtain image information, achieving a substantial increase in speed compared to traditional methods.

Implementation Method 1

irradiating a spatial modulation element configured to generate a plurality of mask patterns, with light from a light source having a plurality of light emission points

Methodology Applied
Scientific EffectLight emission: Light

Implementation Method 2

The spatial modulation element 108 generates and presents a plurality of mask patterns 108a. The spatial modulation element 108 causes the collimate light from the collimator lens 106 to be transmitted through or reflected according to one generated mask pattern 108a (in FIG. 6, only reflection is described) to modulated mask image (light) 109

Methodology Applied
Scientific EffectLight modulation:

Implementation Method 3

The condenser lens 110 condenses all of light transmitted through or reflected by the target object 102 to the detector 112

Methodology Applied
Scientific EffectLight condensation: Focusing

Implementation Method 4

The detector 112 detects a light intensity of all of light condensed in one mask pattern 108a

Methodology Applied
Scientific EffectLight detection: Photoelectric Effect

Data Source

PatentUS12289540B2Imaging method and imaging device calculating the correlation between light intensity and a spatially modulated mask image to construct an image of a target object
Publication Date: 2025.04.29 FUJIFILM CORP
  • US12289540B2 patent drawing
  • US12289540B2 patent drawing
  • US12289540B2 patent drawing

AI summary

Pixels of a mask image with which a target object is irradiated are shifted by a determined distance by sequentially turning on one light emission point or two or more light emission points of a light source with respect to a single mask pattern generated in a spatial modulation element, a pixel shift amount of the mask pattern determined by a position of the light emission point to be turned on of the light source is known, the target object is irradiated with mask images according to a plurality of mask patterns depending on the positions of the light emission point of the light source and the spatial modulation element, and a computer calculates a correlation between a light intensity detected by a detector and the mask image with which the target object is irradiated, to construct an image of the target object. With this, an imaging device and an imaging method capable of achieving an increase in speed of mask pattern irradiation in single-pixel imaging and significantly increasing an input speed of single-pixel imaging are provided.