Vector Network Analyzer Digital Optical Interface S-Parameter Measurement

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Solution Overview

Problem

Conventional vector network analyzers are unable to perform S-parameter measurements on devices with digital or optical ports, limiting their applicability to devices with only single analog ports.

Innovation Solution

A vector network analyzer with digital and optical interfaces, capable of determining S-parameters using a single radio frequency port, by generating and receiving analog and digital signals through dedicated interfaces and measuring ports, allowing for flexible connection configurations to accommodate devices with digital or optical inputs/outputs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If a conventional vector network analyzer with only analog radio frequency ports is used, then the device complexity remains low, but the adaptability to devices with digital or optical ports is insufficient

Engineering Contradiction:
Improveadaptability to devices with digital or optical portsVSAvoiddevice complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The vector network analyzer is enhanced with multiple types of interfaces (analog RF ports, digital interfaces, optical interfaces) to perform universal measurements on devices with different port types. The system can measure S-parameters of devices with analog ports, digital ports, or optical ports using a unified measurement architecture, making the analyzer adaptable to diverse device configurations without requiring separate measurement systems.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The measurement system is segmented into separate interface modules: analog RF ports for traditional measurements, digital interfaces (such as I2S, PCM, or other digital audio interfaces) for digital port measurements, and optical interfaces for optical port measurements. Each interface type is independently implemented, allowing the system to handle different signal types while maintaining a unified control and processing architecture.

Inventive Principle:
Principle #1Segmentation

2Adaptability or versatility

If a vector network analyzer is designed to handle multiple interface types (analog, digital, optical), then the adaptability increases, but the device complexity increases

Engineering Contradiction:
Improvecapability to measure devices with single analog portVSAvoiddevice complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

Digital interfaces act as intermediaries between the analog RF ports and digital ports of devices under test. The digital interface converts digital signals to analog signals that can be processed by the RF measurement system, enabling S-parameter measurements of devices with digital ports through the same measurement architecture used for analog devices.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Measurement precision

If only analog radio frequency ports are used, then the device complexity is low, but the measurement precision for devices with digital or optical ports cannot be achieved

Engineering Contradiction:
ImproveS-parameter measurement accuracyVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system changes the signal domain parameters by implementing digital interfaces that can convert between digital and analog domains. This allows the measurement system to operate in the appropriate domain for each device type (analog for RF devices, digital for digital devices) while maintaining unified S-parameter measurement capability through parameter transformation.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS12196794B2Vector network analyzer with digital interface
Publication Date: 2025.01.14 ROHDE & SCHWARZ GMBH & CO KG
  • US12196794B2 patent drawing
  • US12196794B2 patent drawing
  • US12196794B2 patent drawing

AI summary

A measuring device includes a first measuring port connected to an optical interface which can be connected to an optical input or output of a device under test (DUT). The device includes a second measuring port which can be connected to a radio frequency (RF) input or output of the DUT. The optical interface is connected to the optical input of the DUT and the second measuring port is connected to the RF output of the DUT. The first measuring port generates an analog measuring signal and provides it to the optical interface. The optical interface generates an optical measuring signal based on the analog measuring signal and provides it to the optical input of the DUT. The second measuring port receives an analog measuring signal generated by the DUT based on the optical measuring signal. The processor determines S-parameters of the DUT based on the two analog measuring signals.