Vehicle Storage Reliability Testing for Critical Data Stability
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Solution Overview
Problem
Smart vehicles face challenges in maintaining operational stability and reliability due to the increasing complexity of integrated information and communication technologies, which can lead to faults and errors in critical systems like autonomous driving and infotainment systems.
Innovation Solution
A smart vehicle system that includes a test information storage circuit, a controller, and a test circuit to classify and store test results, determine parameter values for reliability tests, and generate test enable signals to assess the characteristics of storage devices, thereby increasing operational stability and reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If various ICTs are integrated into the vehicle to provide infotainment and telematics functions, then user convenience and comfort are improved, but system complexity increases leading to faults and errors in critical systems
Solution Approach 1:
The patent divides the storage system into multiple storage circuits (first storage circuit and second storage circuit) with different reliability levels. Critical data is stored in the higher reliability storage circuit while non-critical data is stored in the lower reliability storage circuit, thereby segmenting the storage function to manage system complexity and improve reliability of critical operations.
2Reliability
If multiple storage circuits are used to store different types of data, then data reliability is improved, but device complexity increases
Solution Approach 1:
The controller dynamically determines which storage circuit to use based on the type of data being stored. Critical data (such as autonomous driving information) is automatically directed to the higher reliability storage circuit, while non-critical data (such as infotainment data) is directed to the lower reliability storage circuit. This dynamic allocation optimizes reliability without requiring manual configuration or complex fixed architecture.
3Reliability
If critical data is stored in high reliability storage circuits, then operational stability is improved, but manufacturing cost increases
Solution Approach 1:
The patent applies different quality levels of storage circuits to different data types based on their criticality. Instead of using high reliability storage circuits for all data (which would increase overall manufacturing cost), the system uses high reliability storage only for critical data (autonomous driving information) and standard reliability storage for non-critical data (infotainment information), thereby optimizing the balance between reliability and manufacturing cost through localized quality differentiation.
Data Source
AI summary
A smart vehicle system is disclosed, which relates to technology for increasing driving stability of a vehicle by performing a test related to reliability of the vehicle. The smart vehicle system includes a test information storage circuit, a controller, and a test circuit. The test information storage circuit classifies a test control information, a test condition information, and a test result information according to a plurality of test levels, and to stores a classified test result information therein. The controller determines at least one parameter value for performing a reliability test in response to a sensing information, the test control information, and the test condition information, and to generates a test enable signal in response to the parameter value. The test circuit tests a characteristic of a storage circuit in response to the test enable signal.