Vertical EFEM Load Lock Layout for Compact Wafer Handling

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Solution Overview

Problem

Current wafer processing apparatuses are inefficient in terms of size, leading to suboptimal use of space in process chambers, which hampers processing efficiency per unit area.

Innovation Solution

The design incorporates a vertically overlapping load lock with the EFEM chamber, allowing for a compact configuration by connecting the atmosphere control chamber and EFEM chamber atmospheres, and utilizing a wafer transfer arm to efficiently move wafers between processing chambers, thereby reducing the overall size of the apparatus while maintaining processing efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the wafer processing apparatus uses a conventional horizontal arrangement of chambers, then the operational flow is simple, but the apparatus occupies excessive space and reduces processing efficiency per unit area

Engineering Contradiction:
Improveprocessing efficiency per unit areaVSAvoidapparatus footprint area
Core Design Contradiction:
ProductivityVSArea of stationary object

Solution Approach 1:

The patent transitions from a conventional horizontal arrangement of chambers to a vertical stacked configuration where the load lock chamber is positioned above the EFEM chamber. This dimensional change allows multiple processing chambers to be arranged vertically, significantly reducing the horizontal footprint area while maintaining operational efficiency and improving processing capacity per unit area.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent implements a nested structure where the wafer transfer arm operates within the vertical space between chambers, and the atmosphere control system is integrated into the chamber structure. This nesting approach maximizes space utilization and reduces the overall apparatus footprint while maintaining all necessary functional components.

Inventive Principle:
Principle #7Nested doll (Nesting)

2Area of stationary object

If the load lock chamber is positioned vertically above the EFEM chamber, then the apparatus size is reduced, but the atmosphere control between chambers becomes more complex

Engineering Contradiction:
Improveapparatus footprint areaVSAvoidatmosphere control system complexity
Core Design Contradiction:
Area of stationary objectVSDevice complexity

Solution Approach 1:

The patent introduces an atmosphere control system with separate air supply and exhaust systems for the load lock chamber and EFEM chamber. This intermediary control mechanism manages the atmospheric transition between vertically stacked chambers, enabling independent atmosphere control while simplifying the overall system architecture and reducing complexity compared to integrated approaches.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent divides the atmosphere control system into separate modular units for the load lock chamber and EFEM chamber, each with its own air supply and exhaust pathways. This segmentation allows independent control and optimization of each chamber's atmosphere while reducing the complexity of inter-chamber atmospheric management.

Inventive Principle:
Principle #1Segmentation

3Productivity

If multiple processing chambers are connected to a single wafer transfer chamber, then the processing capacity increases, but the wafer transfer arm's operational complexity increases

Engineering Contradiction:
Improveprocessing capacityVSAvoidwafer transfer arm operational complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent implements a dynamically controllable wafer transfer arm system that can selectively connect to different processing chambers based on operational requirements. The transfer arm incorporates movable positioning mechanisms and selective gating that allow it to efficiently manage multiple chamber connections without requiring complex simultaneous operations, thereby increasing processing capacity while controlling operational complexity.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS11804393B2Wafer processing apparatus including equipment front end module (EFEM) and wafer processing method using the same
Publication Date: 2023.10.31 SAMSUNG ELECTRONICS CO LTD
  • US11804393B2 patent drawing
  • US11804393B2 patent drawing
  • US11804393B2 patent drawing

AI summary

A wafer processing apparatus of an embodiment of the present disclosure may include an equipment front end module (EFEM), a wafer transfer chamber, a wafer processing chamber, and a wafer transfer arm. In addition, the EFEM may include an atmosphere control chamber configured to store a wafer carrier accommodating wafers, an upper air supplier configured to supply air into the atmosphere control chamber, an EFEM chamber under the atmosphere control chamber, a load lock arranged to be vertically overlapped by at least a portion of the EFEM chamber, and an EFEM arm configured to transfer the wafer carrier.