Vertical Gas Supply Duct for Uniform Semiconductor Film Deposition

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Solution Overview

Problem

Existing semiconductor heat processing apparatuses face challenges in achieving uniform film thickness and gas flow rate due to variations in the gap between the reaction tube and substrates, leading to non-uniform film deposition and increased particle contamination.

Innovation Solution

A heat processing apparatus with a gas supply duct integrally formed outside the reaction tube, featuring vertically arranged gas delivery holes that communicate with the duct, reduces the gap between the tube and substrates, allowing for increased hole diameters and stable gas flow, thereby improving planar uniformity and reducing particle contamination.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a large number of holes are formed in a gas nozzle to decrease gas concentration variations, then film thickness uniformity is improved, but the pressure gradient in the vertical direction increases and product deposition on hole edges occurs

Engineering Contradiction:
Improvefilm thickness uniformityVSAvoidproduct deposition on hole edges
Core Design Contradiction:
Manufacturing precisionVSObject-generated harmful factors

Solution Approach 1:

The gas supply structure transitions from a conventional horizontal nozzle configuration to a vertical gas supply duct arrangement. This dimensional change allows gas to be supplied from the bottom upward through the reaction tube, fundamentally altering the flow pattern and eliminating the pressure gradient issues associated with horizontal multi-hole nozzles while maintaining uniform gas distribution

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The gas supply system is divided into multiple vertical ducts (first and second gas supply ducts) that are positioned at different locations within the reaction tube. Each duct independently supplies gas to specific regions, enabling segmented control of gas flow and concentration distribution throughout the reaction space, thereby achieving uniform film deposition without the harmful effects of single-nozzle multi-hole configurations

Inventive Principle:
Principle #1Segmentation

2Stress or pressure

If the opening diameters of holes in the gas nozzle are increased to decrease pressure gradient, then gas flow uniformity is improved, but the gap between reaction tube and substrates increases and planar uniformity degrades

Engineering Contradiction:
Improvepressure gradientVSAvoidplanar uniformity of film thickness
Core Design Contradiction:
Stress or pressureVSManufacturing precision

Solution Approach 1:

The invention replaces the conventional horizontal nozzle with a vertical gas supply duct configuration. Gas flows upward from the bottom of the reaction tube through vertically oriented ducts, creating a fundamentally different pressure distribution pattern. This vertical arrangement naturally reduces pressure gradients without requiring large hole diameters, as the gas flow path is optimized by the vertical orientation and the spacing between the ducts and substrates is controlled to maintain appropriate gaps

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

Different regions of the reaction tube are served by different gas supply ducts positioned at specific locations. The first gas supply duct is positioned to supply gas to certain substrate regions while the second duct serves other regions, allowing localized optimization of gas flow characteristics. This segmented approach enables each duct to maintain appropriate pressure gradients and gap distances for its specific service area, achieving overall planar uniformity

Inventive Principle:
Principle #3Local quality

3Manufacturing precision

If the reaction tube wall surface is projected outwardly to decrease the gap between tube and substrates, then planar uniformity is improved, but the pressure resistance of the reaction tube decreases and cleaning time prolongs

Engineering Contradiction:
Improveplanar uniformity of film thicknessVSAvoidpressure resistance of reaction tube
Core Design Contradiction:
Manufacturing precisionVSStrength

Solution Approach 1:

Instead of modifying the reaction tube wall geometry by projecting it outward, the invention introduces vertical gas supply ducts that extend downward to approach the substrates from below. This vertical gas supply approach achieves the desired proximity to substrates for uniform film deposition without altering the reaction tube's structural integrity. The ducts are positioned in the vertical dimension to minimize gaps while maintaining the reaction tube's original cylindrical shape and pressure resistance

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The gas supply ducts act as intermediary structures that mediate between the gas source and the substrates. These ducts are positioned to provide close proximity to the substrates for uniform gas distribution, while the reaction tube maintains its original structure and pressure resistance. The ducts serve as the intermediate element that achieves the gap reduction goal without compromising the reaction tube's structural strength or cleaning accessibility

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The apparatus achieves improved planar uniformity of film thickness and stable gas flow, reducing the need for frequent cleaning and maintaining a low pressure atmosphere, which minimizes particle generation and extends processing time.

Implementation Method 1

a gas supply system connected to a bottom portion of the gas supply duct to supply a process gas to the process field through the gas supply duct and the gas delivery opening

Methodology Applied
Scientific EffectGas flow:

Implementation Method 2

a heater configured to heat the target substrates in the process field

Methodology Applied
Scientific EffectHeating: Heating

Implementation Method 3

an exhaust system configured to exhaust an interior of the process field

Methodology Applied
Scientific EffectPressure gradient: Pressure Gradient

Implementation Method 4

a film formation process by a CVD process

Methodology Applied
Scientific EffectChemical vapour deposition: Chemical Vapour Deposition

Data Source

PatentUS8002895B2Heat processing apparatus for semiconductor process
Publication Date: 2011.08.23 TOKYO ELECTRON LTD
  • US8002895B2 patent drawing
  • US8002895B2 patent drawing
  • US8002895B2 patent drawing

AI summary

A heat processing apparatus for a semiconductor process includes a reaction tube including a process field configured to store a plurality of target substrates stacked at intervals. A gas supply duct is integrally provided outside the wall of the reaction tube to extend vertically in a range that covers the process field. A plurality of gas delivery holes are formed in the side portion of the wall of the reaction tube, to be vertically arrayed in a range that covers the process field and communicate with the gas supply duct. A gas supply system is connected to a bottom portion of the gas supply duct to supply a process gas to the process field through the gas supply duct and the plurality of gas delivery holes.