Vertical and Horizontal Gate Semiconductor Device Integration

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Solution Overview

Problem

Trench gate-type MOSFETs are limited to single-device applications due to the need for substrate connection at the drain terminal, preventing integration with horizontal-type devices and increasing chip area for high voltage and current capacity.

Innovation Solution

A semiconductor device with both vertical and horizontal type gates is developed, featuring channels and drains formed in a horizontal direction while maintaining a vertical channel structure, allowing for high integration and increased breakdown voltage through specific doping and oxide layer formation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If trench gate-type MOSFET structure is used, then high integration and low source-drain on resistance are achieved, but the device cannot be integrated with horizontal-type devices and requires substrate connection at drain terminal

Engineering Contradiction:
Improveintegration capabilityVSAvoidcompatibility with horizontal-type devices
Core Design Contradiction:
ProductivityVSAdaptability or versatility

Solution Approach 1:

The patent merges the vertical gate structure and horizontal gate structure into a single semiconductor device. The vertical gate extends from the first surface through the semiconductor layer to the second surface, while horizontal gates are formed at different levels within the semiconductor layer, creating a three-dimensional integrated structure that combines both gate orientations

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent transitions from traditional two-dimensional planar or trench gate structures to a three-dimensional structure by forming vertical gates that extend through the semiconductor layer thickness and horizontal gates at different depths, utilizing the third dimension (vertical depth) to achieve higher integration without compromising adaptability

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Power

If horizontal channels are formed in drain extended MOSFET, then high voltage and current capacity are achieved, but chip area is increased

Engineering Contradiction:
Improvevoltage and current capacityVSAvoidchip area
Core Design Contradiction:
PowerVSArea of stationary object

Solution Approach 1:

The patent nests horizontal channels within the vertical gate structure. The horizontal channels are formed at different depth levels within the semiconductor layer, surrounded by the vertical gate, creating a nested configuration where the vertical gate envelops multiple horizontal channel regions, thereby achieving high power capacity in a compact volume

Inventive Principle:
Principle #7Nested doll (Nesting)

Solution Approach 2:

The semiconductor layer is structured with multiple voids and channels at different levels - horizontal channels for current flow and vertical trenches for gate formation. This porous-like three-dimensional structure increases the effective channel volume for power handling while maintaining a compact external footprint

Inventive Principle:
Principle #31Porous materials

Data Source

PatentUS8022476B2Semiconductor device having vertical and horizontal type gates and method for fabricating the same
Publication Date: 2011.09.20 MARVELL ASIA PTE LTD
  • US8022476B2 patent drawing
  • US8022476B2 patent drawing
  • US8022476B2 patent drawing

AI summary

A semiconductor device having both vertical and horizontal type gates and a method for fabricating the same for obtaining high integration of the semiconductor device and integration with other devices while also maximizing the breakdown voltage and operational speed and preventing damage to the semiconductor device.