Vertical LED Fabrication Pre-Diffusion Metal Layer

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Solution Overview

Problem

Infrared light-emitting diodes face issues with metal diffusion from the reflective layer into the epitaxial layer during high-temperature fusion, leading to reduced light extraction efficiency due to black ohm-contact holes that absorb light.

Innovation Solution

A fabrication method for vertical light-emitting diodes involves growing a transparent insulating layer with through-holes, a metal reflective layer that pre-diffuses metal molecules at a controlled temperature, and high-temperature fusion to form a mixed interface, reducing metal diffusion and improving ohm-contact quality.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If high temperature fusion is adopted to obtain good ohm-contact effect, then contact quality is improved, but metal diffusion to the epitaxial layer increases and light extraction efficiency decreases

Engineering Contradiction:
Improveohm-contact qualityVSAvoidmetal diffusion
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent applies preliminary action by performing pre-diffusion of metal molecules at controlled temperature (130-170°C) during the growth process before the high-temperature fusion step. This preliminary diffusion prepares the metal-semiconductor interface to reduce subsequent metal diffusion during high-temperature fusion, thus maintaining good ohm-contact quality while minimizing harmful metal diffusion into the epitaxial layer.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If high temperature fusion is used to form ohm contact, then contact resistance is reduced, but light absorption by ohm contact holes increases

Engineering Contradiction:
Improvecontact resistanceVSAvoidlight extraction efficiency
Core Design Contradiction:
ReliabilityVSIllumination intensity

Solution Approach 1:

The patent applies parameter changes by precisely controlling the temperature parameter during metal layer growth (130-170°C) to achieve optimal pre-diffusion conditions. This temperature control creates a mixed interface that reduces metal diffusion into the semiconductor layer, resulting in lighter-colored ohm contact holes that absorb less light while maintaining low contact resistance.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method enhances light extraction efficiency by minimizing metal diffusion and improving the appearance of ohm-contact holes, resulting in increased luminance of infrared light-emitting diodes.

Implementation Method 1

metal molecules in the metal reflective layer pre-diffuse from the holes to the second semiconductor layer to form a mixed interface

Methodology Applied
Scientific EffectDiffusion: Diffusion

Implementation Method 2

heating temperature in Step 3) is T1, wherein, 130° C.≤T1≤170° C.; through heating, metal molecules in the metal reflective layer pre-diffuse

Methodology Applied
Scientific EffectHeating: Heating

Implementation Method 3

the working temperature of the high-temperature fusion in Step 4) is T2, wherein 450° C.≤T2≤520° C.

Methodology Applied
Scientific EffectAnnealing: Annealing

Data Source

PatentUS10446718B2Fabrication method of vertical light-emitting diode
Publication Date: 2019.10.15 QUANZHOU SANAN SEMICON TECH CO LTD
  • US10446718B2 patent drawing
  • US10446718B2 patent drawing
  • US10446718B2 patent drawing

AI summary

A fabrication method of a vertical light-emitting diode, such as an infrared light-emitting diode, includes heating the reaction chamber during growth of the reflective layer to pre-diffuse the metal molecules of the reflective layer into the epitaxial layer. As a result, the diffusion of the metal molecules in the reflective layer into the epitaxial layer during high-temperature fusion of the reflective layer and the epitaxial layer slows down, and the blackness level of conventional ohm contact holes is reduced.