Vertical Channel Memory Layout With Dual Insulating Blocks

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Solution Overview

Problem

Existing semiconductor memory devices face challenges in achieving reliable performance due to limitations in the design and manufacturing processes, particularly in the integration of vertical channel transistors.

Innovation Solution

The semiconductor memory device incorporates a unique structure with a memory cell area featuring multiple vertical channel transistors, surrounded by an interface area with specific insulating blocks. These insulating blocks, made of different materials, are strategically placed to enhance the device's reliability and manufacturing efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a separate insulating layer is used in the substrate, then manufacturing precision is improved, but device complexity and manufacturing cost increase

Engineering Contradiction:
Improvesubstrate insulating layer precisionVSAvoidsubstrate structure complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent merges the substrate and insulating layer into a single integrated structure. The semiconductor substrate itself is designed with insulating properties through material selection and structural design, eliminating the need for a separate insulating layer while maintaining electrical isolation and mechanical stability.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The substrate is designed to serve multiple functions simultaneously: it provides mechanical support, electrical isolation, and structural foundation for the vertical channel transistors. This multi-functional design replaces what would traditionally require separate dedicated insulating layers.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Device complexity

If vertical channel transistors are integrated without additional insulating blocks, then device complexity is reduced, but reliability deteriorates

Engineering Contradiction:
Improveinsulating block structureVSAvoidtransistor integration reliability
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

Instead of using uniform insulating blocks throughout the device, the patent applies localized insulating structures only where needed for electrical isolation between vertical channel transistors. This targeted approach maintains reliability by providing isolation at critical interfaces while minimizing overall device complexity.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent introduces intermediate insulating structures that mediate between the vertical channel transistors and surrounding structures. These insulating blocks act as intermediaries to prevent electrical interference and ensure proper isolation without requiring extensive insulating layers throughout the entire device.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Manufacturing precision

If multiple different materials are used for insulating blocks, then manufacturing precision is improved, but ease of manufacture deteriorates

Engineering Contradiction:
Improveinsulating block differentiationVSAvoidmanufacturing process complexity
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent segments the insulating structure into distinct blocks that can be manufactured separately and then integrated. This segmentation allows each insulating block to be optimized for specific functions while using a limited set of materials, simplifying the manufacturing process compared to using many different materials throughout.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent achieves functional differentiation of insulating blocks through parameter changes such as geometry, position, and thickness rather than through material composition changes. This approach maintains manufacturing simplicity by using a limited material palette while still achieving the required functional diversity through structural parameter optimization.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20250176209A1Semiconductor memory device and method of manufacturing the same
Publication Date: 2025.05.29 SAMSUNG ELECTRONICS CO LTD
  • US20250176209A1 patent drawing
  • US20250176209A1 patent drawing
  • US20250176209A1 patent drawing

AI summary

A semiconductor memory device includes a memory cell area including a plurality of vertical channel transistors, an interface area surrounding the memory cell area in a plan view, a first insulating block in the interface area, the first insulating block facing the plurality of vertical channel transistors, and a second insulating block apart from the plurality of vertical channel transistors in a first horizontal direction with the first insulating block between the second insulating block and the plurality of vertical channel transistors, the second insulating block including a different material from the first insulating block.