Vertical Semiconductor Devices with Multiple Threshold Voltages

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Solution Overview

Problem

Advanced semiconductor technology requires integration of multiple functions into a single chip, necessitating a semiconductor device with multiple threshold voltages to enhance performance and reduce chip dimension.

Innovation Solution

A method involving forming and implanting processes to fabricate vertical devices with multiple thresholds, using deposition, photolithography, and etching processes, with conductive layers and dopants implanted at tilted angles to create PMOS and NMOS devices with distinct threshold voltages, and utilizing high-k dielectric layers and salicides to reduce contact resistance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If multiple functions are integrated into a single chip, then chip dimension is reduced and performance is enhanced, but the device requires multiple threshold voltages which increases fabrication complexity

Engineering Contradiction:
Improvechip dimensionVSAvoidfabrication complexity
Core Design Contradiction:
Area of stationary objectVSDevice complexity

Solution Approach 1:

The patent applies local quality by forming different conductive layers with distinct work functions at different locations within the same semiconductor device. Specifically, a first conductive layer with a first work function is formed in a first region, while a second conductive layer with a second work function is formed in a second region, enabling different threshold voltages in different areas of the device to support multiple functions on a single chip

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent segments the gate structure into multiple conductive layers, each with different work functions. The gate electrode is divided into a first conductive layer and a second conductive layer, where each layer can be independently formed and controlled to provide different threshold voltages for different functional regions of the semiconductor device

Inventive Principle:
Principle #1Segmentation

2Adaptability or versatility

If conductive layers with different work functions are formed, then multiple threshold voltages are achieved, but the fabrication process becomes more complex

Engineering Contradiction:
Improvemultiple threshold voltagesVSAvoidfabrication process complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent employs preliminary action by forming the first conductive layer with the first work function before forming the second conductive layer with the second work function. This sequential approach allows each layer to be independently optimized and controlled, simplifying the overall fabrication process while still achieving multiple threshold voltages in the final device

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent utilizes parameter changes by varying the work function parameter of the conductive layers. By selecting materials with different work functions for the first and second conductive layers, the patent achieves different threshold voltages without fundamentally changing the device structure or fabrication methodology

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables the fabrication of semiconductor devices with multiple thresholds, allowing for efficient integration of various functions within a single chip, enhancing performance and reducing chip size effectively.

Implementation Method 1

a method involving forming and implanting processes to fabricate vertical devices with multiple thresholds

Methodology Applied
Scientific EffectIon implantation: Ion Implantation

Implementation Method 2

using deposition, photolithography, and etching processes

Methodology Applied
Scientific EffectPhysical vapor deposition: Physical Vapour Deposition

Data Source

PatentUS11056486B2Semiconductor device with multiple threshold voltage and method of fabricating the same
Publication Date: 2021.07.06 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US11056486B2 patent drawing
  • US11056486B2 patent drawing
  • US11056486B2 patent drawing

AI summary

A semiconductor device includes a first vertical device having a first threshold and second vertical device having a second threshold. The first vertical device includes a first source; a first channel over the first source; a first drain over the first channel; a first conductive layer adjacent to the first channel; and a first gate adjacent to the first conductive layer. The second vertical device includes a second source; a second channel over the second source; a second drain over the second channel; a second conductive layer adjacent to the second channel; and a second gate adjacent to the second conductive layer.