Interconnection structure with anti-adhesion layer

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Solution Overview

Problem

The challenge in semiconductor manufacturing is the adhesion of etching byproducts to inner surfaces during the formation of via and trench openings, which can lead to reduced feature sizes and compromised device performance.

Innovation Solution

An anti-adhesion layer is conformally deposited on the inner surfaces of the recess to prevent the adhesion of etching byproducts, ensuring precise control over the dimensions of via and trench openings by using materials with different adhesion properties from the dielectric structure, thereby protecting the liner layer and maintaining the integrity of the openings.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If etching process is performed to form via and trench openings, then openings are formed through the dielectric structure, but etching byproducts adhere to inner surfaces causing reduced feature sizes

Engineering Contradiction:
Improveopening size controlVSAvoidetching byproduct adhesion
Core Design Contradiction:
Manufacturing precisionVSObject-generated harmful factors

Solution Approach 1:

An anti-adhesion layer is deposited on the inner surfaces of the recess to serve as an intermediary between the etching byproducts and the dielectric structure. This layer prevents direct adhesion of byproducts to the opening walls, thereby maintaining the intended feature dimensions and preventing size reduction during subsequent etching operations.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The anti-adhesion layer is deposited in advance before the etching process that forms the via and trench openings. This preliminary action prepares the surfaces with low adhesion properties, ensuring that when etching byproducts are generated, they will not adhere to the opening walls and cause dimensional inaccuracies.

Inventive Principle:
Principle #10Preliminary action

2Manufacturing precision

If anti-adhesion layer is deposited on inner surfaces, then adhesion of etching byproducts is prevented, but additional process step is added

Engineering Contradiction:
Improvedimensional controlVSAvoidprocess steps
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The anti-adhesion layer changes the surface energy parameters of the inner walls, transforming them from high adhesion to low adhesion surfaces. This parameter change prevents byproduct adhesion without requiring complex process modifications, as the layer can be deposited using standard thin film deposition techniques.

Inventive Principle:
Principle #35Parameter changes

3Ease of manufacture

If conventional etching is performed without anti-adhesion layer, then process is simpler, but feature size accuracy is compromised

Engineering Contradiction:
Improveprocess simplicityVSAvoidfeature size accuracy
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The anti-adhesion layer acts as a disposable protective coating that is deposited, performs its function during etching, and can be subsequently removed or remains as a thin residual layer. This inexpensive, single-use layer protects the critical dimensions without requiring complex or expensive process modifications.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The anti-adhesion layer effectively prevents the reduction in opening sizes due to etching byproducts, ensuring accurate feature formation and enhancing device performance by maintaining the intended dimensions and reducing unwanted etching of underlying structures.

Implementation Method 1

An anti-adhesion layer is conformally deposited on the inner surfaces of the recess to prevent the adhesion of etching byproducts

Methodology Applied
Scientific EffectAdhesion: Adhesive

Implementation Method 2

an anti-reflection layer 108 is formed on the dielectric structure 106

Methodology Applied
Scientific EffectOptical interference: Interference

Data Source

PatentUS12538774B2Interconnection structure with anti-adhesion layer
Publication Date: 2026.01.27 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US12538774B2 patent drawing
  • US12538774B2 patent drawing
  • US12538774B2 patent drawing

AI summary

A device comprises a non-insulator structure, a dielectric layer, a metal via, a metal line, and a dielectric structure. The dielectric layer is over the non-insulator structure. The metal via is in a lower portion of the dielectric layer. The metal line is in an upper portion of the dielectric layer. The dielectric structure is embedded in a recessed region in the lower portion of the dielectric layer. The dielectric structure has a tapered top portion interfacing the metal via.