Virtual Grid Line Image Sensor for Fine Particle Counting
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional cell counters face accuracy issues due to manufacturing variations and unclear grid patterns, which degrade the precision of counting fine particles like cells, as the grid patterns are often printed or laser-machined and can obscure cells, and the molding process introduces significant manufacturing variations.
Innovation Solution
An image sensor package with a virtual grid line system, comprising a lens-free image sensor array, a grid pattern layer with protruding patterns forming a virtual grid line, a dam pattern layer creating a channel, and a cover glass, along with an image processing device to extract and correct the virtual grid line, enabling precise counting of fine particles.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a grid pattern is formed through printing or laser machining on a conventional cell counter, then the grid pattern can be provided for cell counting reference, but the cells may be partially covered by the grid pattern and the boundary serving as a reference for counting becomes unclear
Solution Approach 1:
The patent replaces the conventional mechanical/grid-based reference system with an image processing-based virtual grid system. The physical grid pattern layer is replaced by generating virtual grid lines through image processing algorithms that analyze the captured cell image and automatically establish counting boundaries, eliminating the obscuring effect of physical grids while maintaining accurate counting references.
Solution Approach 2:
The patent introduces an image processing device as an intermediary between the captured cell image and the counting result. This intermediary processes the image data to generate virtual grid lines and automatically counts cells based on these dynamically generated boundaries, rather than relying on fixed physical grids that may obscure cells.
2Productivity
If cell counters are manufactured through molding process or injection-molding process, then the cell counters can be mass-produced, but manufacturing variation of 1-20 μm or more is made between cell counters
Solution Approach 1:
The patent creates a virtual copy of the grid pattern through image processing algorithms rather than relying on physical manufacturing precision. The virtual grid lines are generated computationally based on the captured image, eliminating the need for high-precision physical manufacturing while maintaining consistent counting references across all devices.
Solution Approach 2:
The patent changes the parameter basis from physical dimensional precision (manufacturing-dependent) to computational parameter generation (software-dependent). By generating virtual grid lines through image processing, the system transitions from being sensitive to manufacturing variations to being consistent across different physical instances.
3Ease of manufacture
If a conventional cell counter with physical grid pattern is used, then the structure is simple and easy to manufacture, but the boundary serving as reference for counting becomes unclear when cells are partially covered
Solution Approach 1:
The patent replaces the mechanical grid pattern structure with a computational virtual grid system. Instead of manufacturing physical grid lines that may obscure cells, the system captures an image of the cell chamber and generates virtual grid lines through image processing, providing clear counting boundaries without physical obscuration.
Data Source
AI summary
An image sensor package, a system, and a method for counting fine particles by using a virtual grid line are provided. The image sensor package includes an image sensor array, a grid pattern layer formed on an outer area of the image sensor array and including a plurality of protruding patterns spaced apart from each other while protruding toward the central area of the image sensor array to form a virtual grid line, a dam pattern layer formed on the grid pattern layer, having a specific height, and configured to form a channel or a chamber for receiving the fine particles to be counted, and a cover glass formed on the dam pattern layer.