Virtual Projection Defect Localization From Limited-Angle X-Ray Data
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Solution Overview
Problem
Existing nondestructive inspection techniques for identifying the three-dimensional position of defects in inspection targets using radiation face challenges with limited projection directions and require extensive data acquisition, which is time-consuming and often incomplete.
Innovation Solution
An information processing apparatus and method that utilize projection data from multiple directions, combined with attenuation and shape information, to generate virtual projection data and accurately identify defects, including their three-dimensional positions, even with a small number of data points or limited projection directions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If radiation is irradiated from a large number of different directions to acquire projection data for three-dimensional defect identification, then measurement precision is improved, but loss of time increases
Solution Approach 1:
The patent applies preliminary action by pre-storing simulation X-ray images that simulate different shapes of the inspection target before actual inspection. During inspection, the system compares projection data with these pre-generated simulation images to quickly identify defects and their three-dimensional positions without requiring comprehensive multi-directional radiation irradiation, thus reducing inspection time while maintaining accuracy.
2Ease of operation
If projection data is acquired from limited projection directions due to inspection target constraints, then ease of operation is improved, but measurement precision deteriorates
Solution Approach 1:
The patent uses copying by creating simulation X-ray images that replicate different shapes and structures of the inspection target. These simulation images serve as virtual copies that can be compared with actual projection data obtained from limited angles, enabling the system to infer three-dimensional defect positions even when physical access for multi-directional irradiation is restricted.
Solution Approach 2:
The patent introduces simulation X-ray images as an intermediary between the limited projection data and the three-dimensional defect identification. This intermediary allows the system to bridge the gap between easily obtainable limited-angle data and the need for comprehensive three-dimensional information, enabling accurate defect localization without requiring full multi-directional inspection.
3Productivity
If a small number of projection data points are used for defect identification, then productivity is improved, but measurement precision deteriorates
Solution Approach 1:
The patent replaces the mechanical system of acquiring extensive projection data through multiple radiation directions with an information-processing approach using simulation X-ray images and pattern recognition. This substitution allows the system to achieve high measurement precision with minimal projection data points by leveraging computational methods to infer three-dimensional defect positions from limited two-dimensional projections.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise identification of defects and their positions by generating accurate defect ratio tomographic images, overcoming limitations of existing methods by improving efficiency and accuracy in defect detection.
Implementation Method 1
acquire projection data corresponding to each of at least two imaging positions at which an inspection target is irradiated with radiation from different directions
Data Source
AI summary
An information processing apparatus acquires projection data corresponding to each of at least two imaging positions at which an inspection target is irradiated with radiation from different directions, and identifies a defect in the inspection target, based on the projection data, attenuation information of the inspection target, and shape information of the inspection target.


