Phased Array Virtual Source Imaging for Thick Material Defect Detection
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Solution Overview
Problem
Current phased array imaging techniques face limitations in depth of inspection, focusing quality, handling complex geometries, material anisotropy and inhomogeneity, and non-uniform surface contours, particularly when dealing with thick materials and complex structures.
Innovation Solution
The method employs a phased array transceiver probe with virtual sources, where elements are arranged sequentially without phasing to create multiple beams with the same phase and amplitude, allowing for focused imaging at specific depths and angles, and a control unit directs wave signals for defect evaluation, enabling improved resolution and flexibility in imaging thick materials.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Volume of moving object
If the number of active elements of the phased array system is increased to improve depth of inspection, then the imaging depth is improved, but the electronic complexity and cost increase significantly
Solution Approach 1:
The phased array system is segmented into multiple virtual probes, each with fewer active elements. Instead of using one large array with many elements, the system divides the imaging function across multiple virtual probes, each handling a specific region or depth range. This segmentation reduces the electronic complexity required for each individual virtual probe while maintaining the overall imaging depth capability.
Solution Approach 2:
The patent creates virtual copies of physical probes through signal processing. Multiple virtual probes are generated from a single physical phased array by applying different beamforming parameters and time delays. These virtual probes replicate the functionality of physical probes at different positions and depths, eliminating the need to physically increase the number of transducer elements while maintaining imaging depth.
2Measurement precision
If conventional phased array focusing methods are used, then imaging is achieved, but the focusing quality decreases with increase in the angle of orientation of the beam
Solution Approach 1:
Each virtual probe is configured with specific local parameters including customized aperture weights, time delays, and spatial positioning. This allows each virtual probe to optimize its focusing characteristics for its specific operational region and angle, maintaining high focusing quality across different orientations rather than using a uniform focusing approach that degrades at higher angles.
Solution Approach 2:
The system dynamically adjusts the parameters of virtual probes based on the required imaging depth and angle. The beamforming parameters, including phase shifts and time delays, are adaptively modified for each virtual probe configuration. This dynamic reconfiguration enables the system to maintain optimal focusing quality across a wide range of beam angles by adjusting the operational characteristics of active virtual probes.
3Adaptability or versatility
If current phased array imaging techniques are used, then imaging is performed, but there is no provision for optimization based on complex geometries
Solution Approach 1:
The patent modifies the beamforming parameters of virtual probes to match the specific geometry being imaged. By adjusting parameters such as aperture distribution, time delays, and spatial positioning according to the target geometry, the system optimizes imaging quality for complex shapes. This parameter adaptation enables geometry-specific optimization without requiring fundamental changes to the underlying phased array hardware.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances imaging resolution and depth penetration, improves focusing quality, and allows for optimized imaging of complex geometries and material properties, providing efficient detection and evaluation of defects and anomalies in objects and media.
Implementation Method 1
a phased array wave technique for transmitting and receiving wave signals on and from the area to be inspected
Implementation Method 2
Since the phased array is based on the superposition of waves, the depth to which inspection is possible is directly related to the aperture size
Implementation Method 3
creating a single virtual beam having a specific angle and focused at a specific depth
Implementation Method 4
elements arranged sequentially but without phasing for excitation. Each element of the virtual probe/source receives one pulse
Data Source
AI summary
The invention relates to a method and a device for detecting, measuring and evaluating defects in an object and/or specific material property of an object using a phased array wave technique. The device comprises of a phased array transceiver probe/source and control unit for use in a phased array wave technique for transmitting and receiving wave signals on and from the area to be inspected. The phased array source is divided into a plurality of virtual probes/sources and each virtual probe/source comprises of plurality of elements arranged sequentially but without phasing for excitation.