Virus Particle Identification in Electron Micrographs

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Solution Overview

Problem

Current methods lack effective tools to characterize and quantify intermediate and obscure virus particle forms in electron micrographs, making it difficult to study virus assembly processes and the effects of mutations or antiviral drugs objectively.

Innovation Solution

A method using linear deformation analysis to create templates from a training set of electron micrographs, allowing for the classification and quantification of virus particles by correlating invariant characteristics, and handling variations such as ellipticity, size, and orientation, demonstrated by identifying diverse virus particles in transmission electron micrographs of fibroblasts infected with human cytomegalovirus.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If traditional image analysis tools are used to characterize virus particles, then subjective analysis is required, but objective quantification and classification of intermediate and obscure particle forms cannot be achieved

Engineering Contradiction:
Improveobjectivity of virus particle characterizationVSAvoidcomplexity of image analysis system
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent creates a digital template representing the invariant characteristics of virus particles from a training set of electron micrographs. This template is then used to automatically identify and classify virus particles in new images through correlation analysis, replacing subjective human interpretation with an objective automated system that replicates expert analysis consistently.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The patent transforms virus particle images through linear deformation to normalize their appearance, converting various shapes and orientations into a standard template format. This parameter transformation allows the system to handle variations in particle morphology, size, and orientation while maintaining consistent identification across different images.

Inventive Principle:
Principle #35Parameter changes

2Productivity

If manual characterization of virus particles is performed, then detailed morphological analysis is possible, but the process is time-consuming and subjective

Engineering Contradiction:
Improvethroughput of virus particle analysisVSAvoidobjectivity of classification
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The system uses automatically generated templates from training images to perform self-classification of virus particles in new images. The correlation algorithm automatically compares transformed particle images against the template database without requiring manual intervention, enabling high-throughput objective classification that maintains measurement precision while dramatically increasing productivity.

Inventive Principle:
Principle #25Self-service

3Device complexity

If virus particle templates are created from a small training set, then the system remains simple and manageable, but the ability to handle variations in particle morphology may be limited

Engineering Contradiction:
Improvesimplicity of template systemVSAvoidhandling of particle variations
Core Design Contradiction:
Device complexityVSAdaptability or versatility

Solution Approach 1:

The patent applies linear deformation transformations to the template to dynamically adapt it to various particle shapes and orientations. This allows a single template derived from a small training set to effectively match particles with different morphological variations, maintaining system simplicity while enhancing adaptability through mathematical transformation rather than requiring multiple static templates.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentEP1934860B1Identification and classification of virus particles in textured electron micrographs
Publication Date: 2014.07.23 INTELLIGENT VIRUS IMAGING INC
  • EP1934860B1 patent drawingFigure 1A~1B
  • EP1934860B1 patent drawingFigure 2A~2C
  • EP1934860B1 patent drawingFigure 3A~3B

AI summary

The method is for the identification and characterization of structures in electron micrographs. Structures in a first image are selected. The structures have a first shape type deformed in a first direction. The selected structures are transformed to a second shape type different from the first shape type. The transformed structures of the second shape type are used to form a plurality of templates. A new structure in a second image is identified. The new structure has the first shape type. The second shape type structure of each template is deformed in the first direction. It is determined which template is a preferred template that best matches the new structure.