Visible-Light Flux Detection by Optical Attenuation on Substrates

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Solution Overview

Problem

Automated optical inspection systems struggle to detect clear flux due to its transparent nature, lack of contrasting color, and absence of solid material, leading to increased manufacturing risks and costs when alternative methods are employed.

Innovation Solution

Utilizing visible range image sensors and line-scan cameras to model clear flux as a natural passive optical attenuator, detecting clear flux by quantifying the attenuation rate of visible light based on the amount of flux on a substrate.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If traditional optical inspection methods are used, then the inspection system is simple and low-cost, but clear flux cannot be detected due to its transparent nature

Engineering Contradiction:
Improveflux detection capabilityVSAvoidinspection system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent changes the inspection parameter from visual appearance to optical attenuation properties. By measuring how much visible light is absorbed or attenuated by the flux layer, the system can detect clear flux even though it is transparent and lacks contrasting color. This parameter change enables detection of previously undetectable clear flux without requiring complex additional hardware.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent replaces traditional mechanical or visual inspection methods with optical measurement. Instead of relying on solid material presence or color contrast, the system uses visible light attenuation measurements to detect flux, substituting a simpler optical field-based approach for complex mechanical or chemical detection methods.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Measurement precision

If alternative detection methods are employed to detect clear flux, then detection capability is improved, but manufacturing costs increase

Engineering Contradiction:
Improveclear flux detection accuracyVSAvoidmanufacturing cost
Core Design Contradiction:
Measurement precisionVSEase of manufacture

Solution Approach 1:

The patent utilizes the inherent optical properties of clear flux (its ability to attenuate visible light) for self-detection. The flux material's own physical property of absorbing light serves as the detection mechanism, eliminating the need for expensive external markers, dyes, or complex detection systems. This self-service approach achieves accurate detection while keeping manufacturing costs low.

Inventive Principle:
Principle #25Self-service

3Reliability

If clear flux is used to facilitate soldering, then soldering performance is improved, but detection and quality control become difficult

Engineering Contradiction:
Improvesoldering qualityVSAvoidflux presence detection
Core Design Contradiction:
ReliabilityVSDifficulty of detecting and measuring

Solution Approach 1:

The patent introduces visible light as an intermediary medium to detect flux presence. By shining visible light through the flux layer and measuring the attenuation, the system creates an indirect detection pathway that overcomes the difficulty of directly observing clear flux. This intermediary approach enables reliable quality control while maintaining the use of clear flux for soldering.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enhances process margins and yield without significantly increasing costs, allowing for efficient detection and adjustment of clear flux application, thereby optimizing manufacturing processes.

Implementation Method 1

model clear flux as a natural passive optical attenuator, detecting clear flux by quantifying the attenuation rate of visible light

Methodology Applied
Scientific EffectOptical attenuation: Absorption (EM radiation)

Data Source

PatentUS20250208060A1Methods, apparatus, and articles of manufacture to detect transparent flux with visible light
Publication Date: 2025.06.26 INTEL CORP
  • US20250208060A1 patent drawing
  • US20250208060A1 patent drawing
  • US20250208060A1 patent drawing

AI summary

Systems, apparatus, articles of manufacture, and methods are disclosed to detect transparent flux with visible light. An example apparatus includes interface circuitry to communicate with an image sensor and programmable circuitry to at least one of instantiate or execute machine-readable instructions. Additionally, the example programmable circuitry is to cause the image sensor to capture reflected light off of a substrate, the reflected light being visible. The example programmable circuitry is also to, based on a level of attenuation of the reflected light relative to projected light projected onto the substrate, determine at least one of a presence or a property of transparent flux on the substrate.