Visual Parameterization of Density-Based Anomaly Detection

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Solution Overview

Problem

Current anomaly detection methods in industrial plants, particularly those using density-based clustering algorithms, face challenges in parameterization, requiring time-consuming and user-dependent adjustments to distinguish normal from abnormal behavior effectively, and often fail to account for domain-specific knowledge.

Innovation Solution

A method that maps sensor data points into a pixel space, allowing for rapid visualization and simulation of clustering operations using high-performance hardware, enabling quick parameter adjustments and intuitive understanding of clustering results without deep technical knowledge.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a density-based clustering algorithm is used for anomaly detection, then the selectivity in distinguishing normal from abnormal behavior is improved, but the time required for parameterization and calculation increases significantly

Engineering Contradiction:
Improveanomaly detection accuracyVSAvoidparameterization time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent creates a visual copy of the clustering process by mapping sensor data points to pixel positions and representing cluster formations as visual patterns. This visual representation allows users to understand and adjust parameters without performing actual clustering calculations, dramatically reducing parameterization time while maintaining detection accuracy.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The patent introduces a visual intermediary layer between the clustering algorithm and the user. Instead of directly interacting with complex algorithmic parameters, users interact with visual representations that mediate the parameter adjustment process, making it intuitive and rapid.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Productivity

If automated parameter determination methods are used, then the parameterization process is speeded up, but the results only approximate the optimum and do not account for domain-specific knowledge

Engineering Contradiction:
Improveparameterization speedVSAvoidparameter optimization accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent implements a feedback mechanism where the visual representation of cluster formations provides immediate feedback to the user about the effect of parameter changes. Users can iteratively adjust parameters based on visual feedback until the desired cluster formation is achieved, ensuring both speed and accuracy.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The visual representation system allows users to independently assess and adjust parameters based on their domain knowledge and the visual feedback provided by the system, without relying on automated determination methods that may not account for specific application requirements.

Inventive Principle:
Principle #25Self-service

3Measurement precision

If manual parameter adjustment is performed to achieve optimal clustering results, then the anomaly detection accuracy is improved, but the calculation time increases from seconds to hours

Engineering Contradiction:
Improvecluster formation accuracyVSAvoidcalculation speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent creates a visual copy of the data space where cluster formations can be observed directly as visual patterns. This allows rapid assessment of clustering results and parameter effectiveness without performing multiple time-consuming calculation cycles, achieving both accuracy and speed.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The patent replaces the mechanical calculation process with a visual representation system. Instead of iteratively running clustering algorithms to assess parameter effectiveness, the system visually represents the effects of parameters, allowing instantaneous assessment and adjustment.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Data Source

PatentEP3830660B1Method and assistance system for parameterization of an anomaly detection method
Publication Date: 2022.04.13 SIEMENS AG
  • EP3830660B1 patent drawingFigure 1~2
  • EP3830660B1 patent drawingFigure 3
  • EP3830660B1 patent drawingFigure 4

AI summary

A method for parameterizing an anomaly detection method, which takes a multiplicity of sensor data points as a basis for performing a density-based cluster method, comprising a) mapping (S10) each sensor data point (SP1, SP2, SP3) in a data space into a pixel data point (PP1, PP2, PP3) in a pixel space, b) reproducing (S11) at least one operation of the density-based cluster method in the data space by means of at least one pixel operation in the pixel space, c) receiving (S12) at least one parameter value for each parameter of the density-based cluster method, d) applying (S13) the at least one pixel operation in accordance with the parameter values to the pixel data points (PP1, PP2, PP3), e) outputting (S14) a cluster result in visual form in the pixel space, and f) providing (S16) the received parameter values for the anomaly detection method, and an assistance apparatus (80) for parameterizing an anomaly detection apparatus (90) that performs the anomaly detection method.