Visual Node-Based ADR Workflow Interfaces for X-Ray Defect Recognition
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Solution Overview
Problem
Conventional systems for defect recognition in industrial parts using X-ray scanning lack intuitive and efficient design interfaces, making it difficult for operators to configure custom workflows for analyzing radiography images.
Innovation Solution
The development of visual node-based processing tools and a design interface that allows users to create and configure custom assisted defect recognition (ADR) workflows by placing and connecting image processing blocks on a canvas.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If conventional systems for defect recognition are used, then the basic inspection function is provided, but the ease of operation deteriorates due to lack of intuitive design interfaces
Solution Approach 1:
The patent replaces complex programming interfaces with visual node-based processing tools, allowing users to configure ADR workflows through graphical drag-and-drop operations instead of text-based coding. This substitution dramatically improves ease of operation while maintaining system functionality.
Solution Approach 2:
The patent introduces an intermediary design interface that sits between the user and the complex defect recognition system. This interface provides intuitive controls and visual tools that mediate user interactions, making the complex system easier to operate without exposing the underlying complexity.
2Productivity
If custom ADR workflows are configured manually, then the adaptability improves, but the productivity deteriorates due to time-consuming configuration processes
Solution Approach 1:
The patent provides pre-configured image processing blocks and workflow templates that can be directly applied to common inspection scenarios. Users can start with predefined configurations and modify them as needed, significantly reducing the time required to set up custom ADR workflows while maintaining full adaptability.
Solution Approach 2:
The patent enables users to copy and reuse successful workflow configurations across different inspection tasks. Once a workflow is configured and validated, it can be replicated and adapted for similar applications, dramatically improving productivity without sacrificing adaptability to new requirements.
3Ease of operation
If visual node-based processing tools are implemented, then the ease of operation improves, but the device complexity increases
Solution Approach 1:
The patent divides the complex image processing system into discrete, manageable nodes representing individual processing functions. Each node is independently configurable and visually represented, making the overall system easier to understand and operate despite the complexity of the underlying processing capabilities.
Solution Approach 2:
The patent transitions from traditional one-dimensional linear programming interfaces to a two-dimensional graphical canvas where nodes can be freely positioned and connected. This dimensional change provides intuitive spatial organization and makes workflow configuration more accessible to users.
Data Source
AI summary
Described herein are examples of interfaces for designing and/or configuring custom assisted defect recognition (ADR) systems and/or workflows. In some examples, the ADR systems and/or workflows may be designed and/or configured using visual tools, such as, for example, node based processing tools. In some examples, the ADR workflows may be used to analyze two dimensional (2D) and/or three dimensional (3D) image scans, such as might be generated by industrial X-ray scanning systems.