Void-Arranged Structure Electromagnetic Wave Measurement
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Solution Overview
Problem
Conventional methods for measuring object characteristics using void-arranged structures face errors due to dimensional variations in the structure, requiring multiple measurements and calibration, which increases time and sensitivity to environmental changes, especially when measuring small quantities.
Innovation Solution
A method involving a void-arranged structure with a grid structure and applying electromagnetic waves to detect frequency characteristics, using a difference spectrum calculated from two distinct frequency characteristics to measure object characteristics, eliminating the need for reference measurements and reducing calibration time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If reference measurements are performed to compensate for structural variations, then measurement precision is improved, but measurement time increases and sensitivity to environmental changes worsens
Solution Approach 1:
The patent applies preliminary action by pre-calculating and storing correction values for structural variations in a lookup table during the calibration phase. During actual measurement, the system simply retrieves the appropriate correction value based on measured structural parameters, eliminating the need for time-consuming reference measurements and calibration procedures while maintaining high measurement precision
Solution Approach 2:
The patent replaces the mechanical measurement system with an optical measurement system using light waves. This substitution enables non-contact, high-speed measurement of structural parameters and frequency characteristics, significantly reducing measurement time while improving precision and reducing sensitivity to environmental changes
2Measurement precision
If multiple measurements and calibration are performed, then measurement precision is improved, but productivity decreases
Solution Approach 1:
The patent performs preliminary calibration to establish the relationship between structural parameters and frequency characteristics, storing correction values in advance. This allows rapid measurement without repeated calibration, significantly improving productivity while maintaining measurement precision through the pre-established correction model
Solution Approach 2:
The measurement system performs self-correction by automatically retrieving appropriate correction values from stored data based on measured structural parameters. This self-service mechanism eliminates the need for operator intervention in calibration procedures, improving both productivity and consistency of measurements
3Measurement precision
If reference measurements are used to correct structural variations, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent replaces complex mechanical calibration systems with a simplified optical measurement system combined with computational correction. The system uses light waves to measure structural parameters and applies correction values from pre-stored data, achieving high measurement precision with minimal device complexity and no moving parts
Solution Approach 2:
The patent introduces computational algorithms and pre-stored correction data as intermediaries between the measurement system and the final results. This intermediary layer automatically compensates for structural variations without requiring complex hardware modifications, maintaining measurement precision while minimizing device complexity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances measurement sensitivity and reproducibility, reduces measurement time, and minimizes errors caused by structural variations, allowing for accurate characterization of small object quantities.
Implementation Method 1
applying electromagnetic waves to the void-arranged structure on which the object is held, and detecting the electromagnetic waves transmitted through the void-arranged structure
Data Source
AI summary
A measuring method for measuring characteristics of an object to be measured, the measuring method including holding the object on a void-arranged structure having at least two void portions that pass therethrough in a direction perpendicular to a principal surface thereof, and applying electromagnetic waves to the void-arranged structure on which the object is held to detect frequency characteristics of the electromagnetic waves transmitted through the void-arranged structure. The void-arranged structure has a grid structure in which the void portions are periodically arranged in at least one direction on the principal surface of the void-arranged structure. The characteristics of the object are measured on the basis of a relationship between a first frequency characteristic and a second frequency characteristic.