Analyte Measurement Using Void-Arranged Structure Scattering
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Solution Overview
Problem
Current methods for measuring analyte properties using electromagnetic waves struggle with low sensitivity, particularly for small quantities, requiring large and complex measuring apparatuses due to the reliance on transmittance spectrum analysis and the difficulty in detecting small changes in dip waveforms.
Innovation Solution
A method involving the application of electromagnetic waves to a void-arranged structure holding the analyte, detecting the scattered electromagnetic waves, and analyzing the ratio or width of specific frequency characteristics to improve sensitivity and enable measurement of smaller analyte quantities, utilizing structures that cause pseudo-TE11 or reduce pseudo-TE10 mode resonance phenomena.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If transmittance spectrum analysis is used to measure analyte properties, then measurement capability is provided, but measuring sensitivity is low and detection of small analyte quantities is difficult
Solution Approach 1:
The invention changes the measurement parameter from transmittance spectrum analysis to scattered spectrum analysis. Specifically, it measures the intensity ratio of scattered electromagnetic waves at different frequencies (e.g., f1 and f2) rather than analyzing the entire transmittance spectrum. This parameter change enables detection of small analyte quantities (not more than about 100 ng/mm2) with high sensitivity while using a simpler apparatus that does not require complex spectrometers or frequency acquisition mechanisms.
2Measurement precision
If dip waveform shifting is used to determine analyte quantity, then analyte detection is possible, but the method fails for small quantities where shifting becomes smaller than detection limit
Solution Approach 1:
Instead of measuring the frequency shift of dip waveforms (which becomes undetectable for small analyte quantities), the invention changes to measuring the intensity ratio of scattered electromagnetic waves at specific frequencies. This new parameter provides sufficient signal strength even for analyte quantities not more than about 100 ng/mm2, overcoming the detection limit problem inherent in dip waveform shifting methods.
Solution Approach 2:
The invention utilizes resonance phenomena (pseudo-TE11 mode resonance or reduction of pseudo-TE10 mode resonance) in the void-arranged structure to enhance the scattering signal. By operating at frequencies that excite these resonance modes, the scattered wave intensity is amplified, enabling detection of very small analyte quantities that would otherwise produce signals below the detection threshold.
3Loss of information
If frequency acquisition mechanism is implemented, then frequency information is obtained, but measuring apparatus becomes large-sized and hard to control
Solution Approach 1:
The invention extracts only the essential information needed for analyte detection—the intensity ratio of scattered waves at two specific frequencies—rather than acquiring the complete frequency spectrum. This extraction approach eliminates the need for complex spectrometers and frequency acquisition mechanisms, resulting in a compact, easily controllable apparatus that still provides sufficient information for accurate analyte measurement.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances measuring sensitivity, allowing for the detection of smaller analyte quantities without the need for complex apparatuses by focusing on changes in the ratio or width of specific frequency characteristics, thereby improving measurement accuracy and simplifying the measurement process.
Implementation Method 1
detecting the electromagnetic wave scattered by the void-arranged structure holding the analyte
Implementation Method 2
utilizing structures that cause pseudo-TE11 or reduce pseudo-TE10 mode resonance phenomena
Data Source
AI summary
A measurement method that includes irradiating a void-arranged structure on which an analyte has been held with an electromagnetic wave, detecting an electromagnetic wave scattered on the void-arranged structure, and determining a property of the analyte on the basis of at least one parameter, the parameter including the amount of change in the ratio of the detected electromagnetic wave to the irradiated electromagnetic wave at a specific frequency between the presence and the absence of the analyte.