Volatile Memory Defect Repair During Idle Time
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Solution Overview
Problem
Storage devices using volatile memory as main memory face performance deterioration and data errors due to defective cells, which existing technologies fail to detect and address effectively during idle times.
Innovation Solution
A storage device with a non-volatile memory and volatile memory that performs tests for detecting defective cells during idle times, storing test information and repairing or replacing defective cells to prevent performance degradation and data errors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If volatile memory is used as main memory in storage devices, then data buffering and temporary storage performance is improved, but performance deterioration and data errors occur due to defective cells
Solution Approach 1:
The patent performs defective cell detection and repair operations during idle times before the defective cells can cause data errors. The controller proactively tests volatile memory cells and repairs defective ones using redundancy cells, preventing future failures rather than reacting to errors after they occur.
Solution Approach 2:
The storage device performs self-diagnosis and self-repair by detecting defective cells in volatile memory and automatically repairing them using redundant cells. The system monitors its own health status and executes repair operations without external intervention, maintaining reliability autonomously.
2Reliability
If defective cells are detected and repaired during idle time, then reliability is improved, but device complexity increases due to additional test and repair mechanisms
Solution Approach 1:
The controller performs multiple functions: it manages normal data operations, executes defective cell detection tests, and performs repair operations using redundancy cells. This multi-functional approach consolidates test and repair capabilities within the existing controller, avoiding the need for separate dedicated test equipment and reducing overall system complexity.
Solution Approach 2:
The patent uses redundancy cells that are reserved specifically for replacing defective cells. When a defective cell is detected, it is discarded from service and replaced by activating a redundancy cell. This approach simplifies the repair mechanism by using pre-prepared backup cells rather than requiring complex real-time repair circuits.
3Measurement precision
If comprehensive tests are performed on volatile memory, then defective cell detection accuracy is improved, but productivity decreases due to time consumed during testing
Solution Approach 1:
The patent performs defective cell detection tests periodically during idle times rather than continuously or at fixed intervals regardless of system state. This periodic testing approach ensures comprehensive detection accuracy when the system is not under load, while minimizing impact on productivity by scheduling tests only when idle.
Solution Approach 2:
The system performs preliminary testing during idle time to prevent defective cells from causing problems during active operations. By detecting and repairing defective cells before they can cause data errors, the system maintains high productivity during data operations without needing to perform tests that would interrupt normal operations.
Data Source
AI summary
A storage device including repairable volatile memory and a method of operating the same are provided. The storage device includes a non-volatile memory storing user data, a volatile memory buffering the user data and performing a test for detecting a defective cell on a volatile cell array at an idle time of the storage device, and a controller controlling the volatile memory to perform the test at an idle time and storing test information including a test result or a test history in the non-volatile memory.