Operation Voltage Control Code Calibration for Faster Testing
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Solution Overview
Problem
Existing electronic devices face challenges in setting the operation voltage to a target level, as the generated voltage level may differ from the required target level, necessitating a test to adjust it accordingly.
Innovation Solution
The electronic device and system employ a control pulse generation circuit and a voltage control code generation circuit to selectively generate control pulses and perform addition or subtraction operations on a logic bit set of a voltage control code, thereby setting the voltage level of the operation voltage based on a reference code during a test period.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If the voltage level of the operation voltage is set through a test, then the voltage level can be adjusted to the target level, but the test time increases
Solution Approach 1:
The patent applies preliminary action by pre-storing the reference code in the electronic device before the test begins. This allows the testing process to start immediately without waiting for external provision of the reference code, thereby reducing test time while maintaining voltage level accuracy through the pre-prepared reference data
Solution Approach 2:
The electronic device performs self-service by internally storing and utilizing the reference code during testing. The device generates control pulses and performs voltage level adjustments using its own stored reference data, eliminating the need for repeated external reference code provision and reducing dependency on external systems during the test process
2Manufacturing precision
If the reference code is received repeatedly in each test, then the voltage level can be accurately adjusted, but the test process becomes more complex and time-consuming
Solution Approach 1:
The reference code is stored in advance in the electronic device's memory before testing begins. This preliminary storage eliminates the need for repeated reception and processing of the reference code during multiple tests, simplifying the test process while maintaining the accuracy needed for proper voltage level adjustment
Solution Approach 2:
The system uses the stored reference code to generate control pulses that adjust the operation voltage, creating a feedback loop where the voltage control code generation circuit compares the current voltage level against the reference and makes corrections. This feedback mechanism maintains accuracy without requiring repeated external reference code input
3Manufacturing precision
If the voltage level is adjusted through addition and subtraction operations on voltage control code, then the target voltage level can be achieved, but the control circuit complexity increases
Solution Approach 1:
The patent replaces complex analog voltage control mechanisms with digital logic operations. The voltage control code generation circuit uses binary addition and subtraction operations on voltage control codes to adjust the operation voltage level, substituting mechanical or analog control systems with simpler digital logic that achieves the same precision through bitwise operations
Solution Approach 2:
The system changes the parameter representation from direct voltage control to binary code manipulation. By representing voltage levels as binary voltage control codes and using addition/subtraction on these codes, the system achieves precise voltage level adjustment through parameter transformation, simplifying the control logic while maintaining manufacturing precision
Data Source
AI summary
An electronic device may include: a control pulse generation circuit configured to selectively generate one of a first control pulse and a second control pulse on the basis of a reference code during a test period; and a voltage control code generation circuit configured to perform an addition operation or subtraction operation on a logic bit set of a voltage control code to set the voltage level of an operation voltage on the basis of the first and second control pulses.