Voltage Comparison Circuit Calibration for Built-In Self Test
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Solution Overview
Problem
Existing semiconductor devices require extensive and costly test operations due to complex built-in self test circuits, which increase production time and unit prices, and are prone to errors from noise and space constraints.
Innovation Solution
A semiconductor device with a voltage comparison circuit and calibration control circuit that minimizes configuration complexity by generating a comparison result signal and controlling offset values through calibration operations, allowing for reduced area occupation and accurate internal voltage setting.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of time
If a built-in self test circuit is installed within a semiconductor device, then the time during which the test equipment is used can be reduced, but the configuration of the circuit becomes complicated and the area occupied by the circuit increases
Solution Approach 1:
The built-in self test circuit is divided into functional modules: voltage comparison circuit (100) for voltage comparison, calibration control circuit (200) for offset calibration, and input control circuit (300) for signal routing. This segmentation allows each module to perform its function independently, reducing overall circuit complexity while maintaining test functionality.
Solution Approach 2:
The voltage comparison circuit serves multiple functions: it compares voltages during normal operation and performs calibration during test operations. The calibration control circuit generates calibration codes that adjust the offset value, enabling the same hardware to perform both operational and testing functions, thereby reducing the need for separate dedicated test circuitry.
2Loss of time
If a built-in self test circuit is installed within a semiconductor device, then the time during which the test equipment is used can be reduced, but the area occupied by the circuit increases
Solution Approach 1:
The calibration control circuit (200) is integrated within the same semiconductor device as the voltage comparison circuit (100), sharing common resources such as power supply, control signals, and output interfaces. This merging approach allows the test functionality to be added without proportionally increasing the total area, as common infrastructure is shared between operational and testing functions.
3Extent of automation
If the configuration of the built-in self test circuit is complicated, then some test operations can be performed, but errors may occur in test result values due to noise influence
Solution Approach 1:
The calibration control circuit performs offset calibration before actual test operations to eliminate systematic errors. By pre-adjusting the voltage comparison circuit's offset value using calibration codes, the circuit compensates for manufacturing variations and noise influences, ensuring accurate test results during subsequent automated testing.
Solution Approach 2:
The calibration process uses feedback from the voltage comparison circuit to adjust the offset value. The calibration control circuit generates calibration codes based on comparison results, creating a closed-loop system that automatically adjusts for errors and improves test accuracy without requiring complex external calibration equipment.
Data Source
AI summary
A semiconductor device includes a voltage comparison circuit and a calibration control circuit. The voltage comparison circuit compares test reference voltages and generates a comparison result signal. The calibration control circuit controls an offset value of the voltage comparison circuit.