Voltage Detection Circuit with Segmented Reference Units
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Solution Overview
Problem
Conventional internal voltage generators in semiconductor devices face challenges in maintaining stable internal voltage levels during both test and normal operations, particularly due to high dispersion values caused by varying resistor resistances, which affect reliability and power efficiency.
Innovation Solution
A voltage detection circuit with a test reference voltage generating unit using high input resistance during tests and a normal reference voltage generating unit with a current mirror structure during normal operations, allowing for distinct resistance settings to minimize dispersion and ensure stable voltage generation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single reference voltage generating unit is used for both test and normal operations, then the device complexity is reduced, but the manufacturing precision of internal voltage deteriorates due to high dispersion values during test operations
Solution Approach 1:
The reference voltage generating unit is segmented into two independent sub-units: a test reference voltage generating unit for test operations and a normal reference voltage generating unit for normal operations. This segmentation allows each unit to be optimized for its specific operation mode, with the test unit using high resistance to minimize dispersion and the normal unit using low resistance for power efficiency, thereby resolving the contradiction between device complexity and manufacturing precision.
Solution Approach 2:
The system dynamically switches between the test reference voltage generating unit and the normal reference voltage generating unit based on the operation mode. A control signal activates the appropriate unit during test or normal operations, enabling the reference voltage generation mechanism to adapt its characteristics (high resistance for precision during testing, low resistance for efficiency during normal operation) to the current operational requirements.
2Manufacturing precision
If high input resistance is used in the reference voltage generating unit, then the manufacturing precision of internal voltage is improved during test operations, but the power efficiency deteriorates during normal operations
Solution Approach 1:
The reference voltage generating unit is divided into two specialized sub-units with different resistance characteristics. The test reference voltage generating unit uses high input resistance to minimize dispersion during test operations, while the normal reference voltage generating unit uses low input resistance for power efficiency during normal operations. This segmentation allows each sub-unit to optimize for its specific operational requirement without compromise.
Solution Approach 2:
Different resistance characteristics are applied locally to different operational contexts. The test reference voltage generating unit is designed with high input resistance specifically for test operations where precision is critical, while the normal reference voltage generating unit is designed with low input resistance for normal operations where power efficiency is prioritized. Each local configuration (test or normal) has the quality (resistance value) optimized for its specific purpose.
3Speed
If low power supply voltage is used for high speed operation, then the speed is improved, but the reliability of internal voltage generation deteriorates due to increased sensitivity to noise
Solution Approach 1:
The voltage detection circuit is segmented into specialized detection paths for different operation modes. During test operations, the test reference voltage generating unit with high resistance provides a stable reference that reduces noise sensitivity, improving reliability. During normal low-voltage high-speed operations, the normal reference voltage generating unit with low resistance maintains power efficiency while the segmented structure allows for mode-specific optimization of the detection mechanism.
Solution Approach 2:
The system changes the resistance parameter of the reference voltage generating unit based on operation mode. During test operations, high resistance is used to minimize dispersion and improve reliability. During normal operations, low resistance is used to maintain power efficiency. This dynamic parameter change allows the system to achieve both high speed operation at low voltage and reliable voltage generation by adapting the resistance parameter to operational requirements.
Data Source
AI summary
A voltage detection circuit includes a voltage detection unit suitable for comparing a voltage level of a reference voltage terminal with a voltage level of an internal voltage terminal and for generating a detection signal based on a comparison result, a test reference voltage generating unit suitable for receiving an external reference voltage through a pad and for supplying a test reference voltage, which is generated by using the received external reference voltage, to the reference voltage terminal by using a first input resistance, during a test operation, and a normal reference voltage generating unit having a current mirror structure, wherein the normal reference voltage generating unit is suitable for supplying a current, corresponding to an internal reference voltage, to the reference voltage terminal by using a second input resistance different from the first input resistance, during a normal operation.