Integrated Voltage Detection Circuit for Switch Insulation Monitoring
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Solution Overview
Problem
Existing semiconductor devices require complex circuit configurations to detect voltage abnormalities between high-side and low-side switching elements, increasing component count and size, and fail to efficiently monitor voltage abnormalities during overcurrent conditions.
Innovation Solution
A semiconductor device with a detection circuit and voltage comparator mounted on the same integrated circuit, utilizing a current source and resistor elements to detect voltage abnormalities between the positive and negative electrodes, ensuring insulation and simplifying the circuit configuration.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a diode connected outside the IC is used to ensure insulation between high-side and low-side switching elements, then the required insulation is achieved, but the number of components and circuit size increase
Solution Approach 1:
The patent merges the insulation function with the detection circuit by integrating both functions within the IC. The detection circuit includes a current source and resistors that are connected to ensure insulation between high-side and low-side switching elements while simultaneously detecting voltage abnormalities, eliminating the need for external diodes and reducing component count.
Solution Approach 2:
The detection circuit is designed to perform multiple functions: it ensures insulation between switching elements and detects voltage abnormalities simultaneously. This multi-functionality is achieved by configuring the current source and resistors within the IC to serve both insulation and detection purposes, reducing the need for separate components.
2Reliability
If a complex circuit configuration with external diodes is used to detect voltage abnormalities, then insulation is ensured, but the circuit configuration becomes complicated
Solution Approach 1:
The patent combines the insulation mechanism and voltage abnormality detection into a single integrated detection circuit within the IC. The current source and resistors are configured to both ensure insulation and detect voltage abnormalities, eliminating the need for external diodes and simplifying the overall circuit configuration.
Solution Approach 2:
The detection circuit uses its own internal components (current source and resistors) to simultaneously ensure insulation and detect voltage abnormalities. The circuit serves itself by using the same elements for both insulation and detection functions, eliminating the need for separate external components.
3Reliability
If multiple external components are used for detection, then insulation is ensured, but the monitoring efficiency during overcurrent conditions decreases
Solution Approach 1:
The patent merges insulation and detection functions into a single integrated circuit, allowing simultaneous operation without the delays or inefficiencies associated with multiple external components. The detection circuit monitors voltage abnormalities while ensuring insulation through its internal configuration, improving overall monitoring efficiency during overcurrent conditions.
Solution Approach 2:
The detection circuit performs both insulation and monitoring functions using its own internal components, enabling efficient simultaneous operation. The current source and resistors within the IC work together to maintain insulation while continuously monitoring for voltage abnormalities, improving productivity compared to external component configurations.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively detects voltage abnormalities and prevents overcurrent by simplifying the circuit configuration, ensuring efficient insulation and accurate monitoring of switching element states, thereby protecting the device from unsaturated states.
Implementation Method 1
The voltage comparator outputs a comparison result between a DC voltage input to a second node and a voltage of the first node
Implementation Method 2
The detection circuit includes a current source and a first resistor element having a first electrical resistance value. The current source and the first resistor element are connected in series via a first node between the positive electrode and the negative electrode
Data Source
AI summary
The detection circuit includes a current source and a resistor element which are connected in series via a first node between a positive electrode and a negative electrode of a switching element which is turned on and off by a driving circuit. The voltage comparator outputs a detection signal indicating a comparison result between an input DC voltage and the voltage of the first node. The DC voltage and the electric resistance value of the resistor element are set in such manner that when an inter-electrode voltage between the positive electrode and the negative electrode becomes higher than a predefined determination voltage, the voltage of the first node is higher than the DC voltage. The detection circuit and the voltage comparator are mounted on the same integrated circuit constituting the semiconductor device.