Voltage Limiting Element Lifetime Prediction Using Overvoltage Models
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Solution Overview
Problem
Existing methods for predicting the residual lifetime of voltage limiting elements in surge protective devices fail to accurately account for the effects of overvoltage from power supply systems, leading to incomplete and complex calculations, especially when monitoring leak currents.
Innovation Solution
A method that uses current sensing signals to determine overvoltage parameter values and applies an overvoltage model to predict the residual lifetime of voltage limiting elements, considering the length of the overvoltage period and various overvoltage conditions, including power frequency overvoltage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If existing methods for predicting aging of voltage limiting elements are employed for surges, then the prediction can be made based on surge currents, but the effect of overvoltage from power supply systems is not accounted for, leading to incomplete prediction results
Solution Approach 1:
The patent changes the parameters used for prediction from only surge current parameters to include both overvoltage parameters (voltage magnitude, duration, frequency) and surge current parameters. This allows the prediction model to account for different overvoltage conditions including power frequency overvoltage, impulse overvoltage, and surge currents, thereby improving both accuracy and adaptability.
2Measurement precision
If another method for predicting lifetime of voltage limiting elements is implemented by monitoring leak currents, then the wear and tear of the voltage limiting elements can be tracked, but the test precision requirement increases and the calculation becomes more complicated
Solution Approach 1:
The patent extracts the essential aging indicators from the complex leak current monitoring method and replaces them with direct measurements of overvoltage parameters (voltage magnitude, duration, frequency) and surge current parameters. This extraction simplifies the measurement requirements and reduces calculation complexity while maintaining the ability to predict aging accurately.
Data Source
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AI summary
Embodiments of the present disclosure relate to a method and electronic apparatus for predicting residual lifetime of a voltage limiting element. The method comprises: receiving current sensing signals representing currents flowing through a voltage limiting element within overvoltage period; determining, based on the current sensing signals, overvoltage parameter values of overvoltage parameters within the overvoltage period; and determining, based on a length of the overvoltage period and the overvoltage parameter values, residual lifetime of the voltage limiting element using an overvoltage model of voltage limiting element. The technical solutions in accordance with embodiments of the present disclosure enhance the precision for predicting residual lifetime of the voltage limiting element.