Voltage Margining System Using Non-Deterministic Data
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Solution Overview
Problem
Voltage margining processes in semiconductor devices are complex and time-consuming, often relying on predetermined test patterns that do not test actual data transmitted over interconnects, leading to uncertainty and increased validation times.
Innovation Solution
Implementing a voltage margining system that uses non-deterministic data communicated between ICs via interconnects, allowing for rapid testing and true system compatibility evaluation, utilizing a 3-phase communication protocol with parallel data and margining samplers to efficiently test receiver-only interfaces and reduce post-silicon validation time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If predetermined test patterns are used for voltage margining, then testing can be performed, but the testing does not evaluate actual data transmission and increases validation time
Solution Approach 1:
The system uses the device itself to generate and transmit actual data through the interconnect for margining testing, eliminating the need for external test equipment and predetermined patterns. This self-service approach enables realistic validation while reducing time
Solution Approach 2:
The margining testing is performed early in the validation process using actual data transmission before final product qualification. This preliminary action with real data prevents later discovery of margining issues, reducing overall validation time
2Manufacturing precision
If complex voltage margining processes are used, then thorough testing is achieved, but the process becomes time-consuming
Solution Approach 1:
The patent extracts only the essential margining functionality needed for validation by using a simplified data transmission protocol and direct interconnect testing. This removes unnecessary complexity from traditional margining processes while maintaining thoroughness
Solution Approach 2:
The same interconnect and data transmission infrastructure used for normal operation is also used for margining validation. This multi-functionality eliminates the need for separate complex testing equipment and procedures, improving productivity
Data Source
Figure 1
Figure 2A
Figure 2B~2D
AI summary
In one embodiment, a receiver is coupled to a transmitter via an interconnect. The receiver includes a voltage margining circuit to receive non-deterministic data transmitted by the transmitter via a multi-level signaling scheme and to generate a bit error report including bit error information obtained at a plurality of margining levels. Other embodiments are described and claimed.