Monolithic Voltage Reference Testing with Multi-Temperature Drift Data
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Solution Overview
Problem
Monolithic voltage reference devices are often needlessly rejected or downgraded due to existing testing procedures that fail to accurately assess their temperature drift specifications, as these procedures compare output voltages at non-room temperatures to a fixed room temperature reference, leading to incorrect interpretations of compliance with temperature drift specifications.
Innovation Solution
A testing procedure that measures and stores output voltages at multiple non-room temperatures, allowing for a computation that determines compliance with temperature drift specifications based on both stored temperature information, thereby allowing the temperature drift specification to be interpreted as a sliding range relative to a reference voltage, ensuring accurate certification of devices that meet the specifications.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If output voltage is tested at multiple non-room temperatures and stored in memory, then measurement precision of temperature drift assessment is improved, but device complexity increases due to additional memory storage requirements
Solution Approach 1:
The patent segments the temperature drift assessment into multiple discrete temperature points, each with its own stored output voltage measurement. By dividing the temperature range into specific test points and storing individual measurements for each point, the system achieves comprehensive temperature drift characterization without requiring complex continuous monitoring, thus improving measurement precision while managing device complexity through structured data organization.
2Ease of operation
If traditional testing compares output voltage at non-room temperatures to fixed room temperature reference, then ease of operation is maintained, but measurement precision of temperature drift specification compliance deteriorates
Solution Approach 1:
The patent transforms the static room temperature reference into a dynamic reference system by storing output voltage measurements at multiple temperature points in memory. The reference voltage dynamically adapts to the specific temperature being tested, allowing the system to maintain ease of operation through automated lookup while achieving precise temperature drift specification compliance assessment by comparing against the appropriate temperature-matched reference rather than a fixed room temperature value.
3Reliability
If multiple temperature measurements are stored in memory, then reliability of temperature drift certification is improved, but loss of time during manufacturing testing increases
Solution Approach 1:
The patent applies preliminary action by pre-storing output voltage measurements at multiple temperature points in the device's memory during the testing process. This allows the temperature drift certification to be performed rapidly by simply retrieving and comparing the pre-stored values against the specification, rather than performing time-consuming real-time measurements at each temperature point during final certification, thus improving reliability while minimizing manufacturing time loss.
Data Source
AI summary
A testing procedure may determine whether a monolithic voltage reference device meets a temperature drift specification. A first non-room temperature output voltage of the monolithic voltage reference device may be measured while the monolithic voltage reference device is at a first non-room temperature which is substantially different than room temperature. First non-room temperature information may be stored in a memory within the monolithic voltage reference device which is a function of the first non-room temperature output voltage. A second non-room temperature output voltage of the monolithic voltage reference device may be measured while the monolithic voltage reference device is at a second non-room temperature which is substantially different than the room temperature and the first non-room temperature. Second non-room temperature information may be stored in the memory without destroying the first non-room temperature information which is a function of the second non-room temperature output voltage. A determination may be made whether the monolithic voltage reference device meets the temperature drift specification based on a computation that is a function of both the first non-room temperature information and the second non-room temperature information.