Voltage Regulator Bypass Circuitry for External Testing
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Solution Overview
Problem
Circuit packages with multiple voltage regulators require a method to bypass these regulators during testing to allow external supply voltages, but existing solutions are inefficient and often require multiple pins, which can be undesirable.
Innovation Solution
The implementation of bypass circuitry that includes a low voltage regulator and a medium voltage regulator, with specific bypass signals and logic gates to selectively bypass these regulators using external signals, allowing for the application of external voltages wider than the regulators' output ranges, and optionally reducing the number of pins required.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple voltage regulators are included in the circuit package to power different portions with different voltages, then the adaptability and functionality of the circuit package is improved, but the device complexity increases
Solution Approach 1:
The bypass circuit enables the voltage regulator module to serve dual purposes: normal voltage regulation during operation and bypass mode during testing. By adding bypass circuitry that can disable selected regulators, the same hardware infrastructure supports both testing and normal operation without requiring separate testing equipment, thus improving universality.
2Ease of operation
If bypass circuitry is added to enable external voltage application during testing, then the ease of operation for testing is improved, but the device complexity increases
Solution Approach 1:
The bypass circuit extracts the voltage regulation function temporarily by disabling selected regulators and allowing external voltage sources to directly power the circuits. This separation of functions enables independent testing of voltage regulation capability while maintaining the ability to operate in normal mode when bypass is not activated.
Solution Approach 2:
The bypass circuit acts as an intermediary between the voltage regulator and the loaded circuitry. It provides a controlled path that can either route power through the regulator or bypass it entirely based on testing requirements, mediating between the regulator's output and the circuit's power needs.
3Ease of operation
If separate pins are added for each voltage regulator bypass control, then the ease of operation for selective bypass is improved, but the pin count increases
Solution Approach 1:
Multiple bypass control functions are merged into a single shared pin. The bypass circuit uses logic gates to interpret the external regulator select signal in combination with internal bypass signals, allowing selective bypass of different voltage regulators through a common control interface rather than requiring separate pins for each regulator.
Solution Approach 2:
The external regulator select signal pin serves multiple functions: it participates in the bypass decision logic for different voltage regulators and works in conjunction with internal bypass signals to provide selective control. This multi-functional use of a single pin reduces the overall pin count while maintaining selective bypass capability.
Data Source
AI summary
Disclosed herein is circuitry for bypassing a medium voltage regulator during testing. The circuitry includes a low voltage regulator to, in operation, generate a first voltage within a first voltage range for powering first circuitry, and a medium voltage regulator to, in operation, generate a second voltage within a second voltage range greater than the first voltage range for powering second circuitry. A low voltage regulator bypass circuit generates a low voltage regulator bypass signal that operates to selectively bypass the low voltage regulator. A medium voltage regulator bypass circuit bypasses the medium voltage regulator as a function of the low voltage regulator bypass signal and an external voltage regulator select signal, the bypass of the medium voltage regulator being such that an external voltage can be applied to the second circuitry.

