Voltage Regulator Self-Test Using Logic Load Stress
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Solution Overview
Problem
Self-testing of voltage regulation circuits under varying load conditions is challenging due to the need for precise parameter measurement and high failure rates, especially in applications where voltage regulators must maintain stability across changing loads and over the lifetime of the circuit.
Innovation Solution
A self-testing method using a circular shift of data through logic modules in a voltage regulator circuit, which allows for stress testing without additional hardware, utilizing existing test control and supply-signal monitoring circuitry to monitor the integrity of the voltage regulator and power rail, and providing an indication of potential defects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If additional hardware is added to perform self-testing of the voltage regulator circuit, then measurement precision and test capability are improved, but device complexity and area overhead increase
Solution Approach 1:
The patent makes existing logic modules serve dual purposes: they function as normal logic elements during operation and as test load elements during self-testing. The logic modules are reconfigured between application mode and controlled self-test mode, allowing the same hardware to perform both computational functions and voltage regulator testing functions, thereby eliminating the need for separate dedicated test hardware
Solution Approach 2:
The voltage regulator circuit performs its own self-testing by utilizing its existing logic modules as the test load. The circuit monitors its own output voltage while the logic modules are exercised in self-test mode, allowing the system to autonomously detect potential defects without requiring external testing equipment or additional dedicated test circuits
2Reliability
If the voltage regulator circuit is stressed to maximum load conditions for testing, then reliability assessment is improved, but circuit stability and normal operation are compromised
Solution Approach 1:
The patent dynamically reconfigures the logic modules between application mode and controlled self-test mode. During self-test mode, the modules are exercised with varying load conditions including maximum stress to assess reliability. The mode switching allows the circuit to temporarily withstand stress conditions for testing purposes while maintaining stability during normal operation, as the stress is applied in a controlled and time-limited manner
Solution Approach 2:
The self-testing is performed periodically by switching the logic modules into self-test mode at predetermined intervals. During these periodic test intervals, the circuit is stressed to various load conditions to assess reliability. Between test intervals, the circuit operates in normal application mode, maintaining stability for regular functionality. This periodic approach allows reliability assessment without compromising continuous operational stability
3Reliability
If self-testing is performed under varying load conditions, then reliability and defect detection are improved, but test time and operational interruptions increase
Solution Approach 1:
The patent enables the voltage regulator circuit to perform self-testing without completely interrupting its useful function. The logic modules are reconfigured to self-test mode while the voltage regulator continues to provide regulated voltage output. The testing occurs in parallel with normal operation to the extent possible, minimizing interruptions. Test results are monitored and can trigger alerts or shutdowns only if defects are detected, allowing continuous operation during testing phases
Data Source
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Figure 2A
AI summary
An apparatus embodiment includes a voltage regulator circuit that provides a regulated voltage supply signal, logic state circuitry, test control circuitry, and a supply-signal monitoring circuit. The logic state circuitry includes logic modules that are reconfigured between application controlled self-test modes in which data is shifted through the logic module and while being powered from the regulated voltage supply signal. The test control circuitry operates the controlled self-test mode by causing a predetermined set of the data to shift through the logic modules and that causes the logic state circuitry to load the voltage regulator circuit by stressing the voltage regulator circuit. The supply-signal monitoring circuit monitors a quality parameter of the regulated voltage supply signal and provides an indication of characteristics of the regulated voltage supply signal which bear on a likelihood that the voltage regulator circuit is associated with defective circuitry.