Internal Voltage Trimming Circuit With Averaged Code Stabilization
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Solution Overview
Problem
Existing semiconductor devices face challenges in generating accurate internal voltages for stable operation, as external test equipment is time-consuming and costly, and embedded self-test devices struggle with frequent trimming code fluctuations affecting reliability.
Innovation Solution
An internal voltage trimming circuit within a semiconductor device that integrates a difference between a test voltage and a reference voltage, compares the result, and adjusts the trimming code through a counter and averaging circuit to generate a stable final trimming code, minimizing fluctuations and external noise influence.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If external test equipment is used for voltage trimming, then accurate internal voltage generation is achieved, but test time and cost increase significantly
Solution Approach 1:
The patent implements a built-in self-test (BIST) device that enables the semiconductor device to perform voltage trimming autonomously without external test equipment. The BIST device includes an integration circuit, comparison circuit, transition detection circuit, and counter that work together to generate accurate trimming codes internally, eliminating the need for external testers and significantly reducing test time and cost while maintaining voltage accuracy.
Solution Approach 2:
The patent introduces a BIST device as an intermediary component within the semiconductor device that mediates between the voltage generation circuit and the trimming control. This BIST device acts as a self-contained testing and trimming subsystem that generates test signals, measures voltage levels, and automatically adjusts trimming codes without requiring external test equipment, thus resolving the contradiction between accuracy and test time.
2Loss of time
If BIST device is used for voltage trimming, then test time and cost are reduced, but trimming code fluctuates frequently affecting reliability
Solution Approach 1:
The patent implements a time interval control mechanism that holds the trimming code at its current value for a predetermined time interval before allowing updates. This preliminary holding action filters out frequent fluctuations and noise in the trimming code generation process, ensuring that only stable and reliable trimming codes are applied to the voltage generation circuit, thereby improving operation reliability while maintaining the benefits of BIST.
Solution Approach 2:
The patent introduces a time interval buffer as a cushioning mechanism between the trimming code generation and application processes. This buffer prevents immediate propagation of fluctuating trimming codes by delaying their application until a stable period is confirmed, thus cushioning against reliability issues caused by code fluctuations while maintaining the speed advantages of BIST.
3Measurement precision
If trimming code is updated frequently to maintain accuracy, then voltage precision is improved, but circuit complexity and noise sensitivity increase
Solution Approach 1:
The patent implements a time interval control mechanism that pre-establishes stable periods before trimming code updates are applied. This preliminary action allows the circuit to maintain accurate voltage levels by holding codes steady during critical periods while still allowing updates during stable intervals, thereby maintaining precision without requiring overly complex continuous adjustment circuits.
Data Source
AI summary
A data storage apparatus includes storage and a controller configured to control the storage in response to a request from a host. The controller includes an internal voltage trimming circuit which includes: an integration circuit configured to generate an integration signal by integrating a difference between a test voltage output from a device under test (DUT) and a reference voltage; a comparison circuit configured to generate a comparison signal by comparing the integration signal and the reference voltage; a transition detection circuit configured to output a detection signal according to level transition of the comparison signal; a counter configured to receive an initial trimming code and generate a preliminary trimming code by increasing or reducing the initial trimming code in response to the detection signal; and an average circuit configured to generate a final trimming code by averaging the preliminary trimming code for a determined time interval and provide the final trimming code to the storage.