W-band Test Socket Assembly with Flexible Leadframe and Elastomeric Spacer
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Solution Overview
Problem
Existing test contactor technologies are unable to operate effectively at W-band frequencies due to extreme transmission line impedance mismatches, making it difficult to test semiconductor devices used in advanced applications like RADAR systems in modern automobiles.
Innovation Solution
A socket assembly with a housing containing spring probes, a leadframe assembly featuring impedance-controlled microwave structures and a flexible ground plane, and an elastomeric spacer that supports cantilever members, allowing for reliable contact and signal transmission at W-band frequencies.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If existing test contactor technology is used, then the structure is simple and easy to manufacture, but it cannot operate at W-band frequencies due to extreme transmission line impedance mismatches
Solution Approach 1:
The test contactor is divided into separate functional components: a rigid housing providing structural support, a flexible leadframe assembly containing the microwave structures and ground plane, and an elastomeric spacer providing compliance. This segmentation allows each component to be optimized for its specific function while maintaining overall operational capability at W-band frequencies.
Solution Approach 2:
The leadframe assembly incorporates flexible microwave structures and a flexible ground plane that can dynamically adapt to positioning variations. The elastomeric spacer provides elastic compliance, allowing the system to maintain reliable electrical contact despite mechanical tolerances or thermal expansion, ensuring consistent performance at W-band frequencies.
2Reliability
If rigid structures are used for signal transmission, then manufacturing precision can be maintained, but impedance discontinuities occur due to lack of compliance
Solution Approach 1:
The leadframe assembly uses flexible microwave structures and a flexible ground plane made from thin, compliant materials. These flexible elements can elastically deform to accommodate manufacturing tolerances and assembly variations, maintaining consistent impedance control and reliable signal transmission at W-band frequencies without requiring extremely tight manufacturing precision.
Solution Approach 2:
The elastomeric spacer changes its mechanical parameters (elastic modulus, compliance) to provide the appropriate level of flexibility. By selecting materials and designs with specific elastic properties, the system achieves optimal compliance that compensates for manufacturing variations while maintaining impedance control for reliable high-frequency signal transmission.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables reliable testing of semiconductor devices at W-band frequencies by minimizing impedance discontinuities and providing vertical compliance, ensuring accurate and efficient high-speed signal transmission.
Implementation Method 1
an elastomeric spacer adjacent the leadframe assembly, the elastomeric spacer having one or more holes receiving the spring probes therethrough
Implementation Method 2
contacting the device under test with the spring probes and the microwave structures, and contacting the device under test with the cantilever members
Implementation Method 3
the leadframe assembly having impedance controlled microwave structures
Data Source
Figure 1
Figure 2
Figure 3~4
AI summary
A socket assembly including a housing that has one or more spring probes therein. The socket assembly further includes a leadframe assembly that has one or more cantilever members, and the leadframe assembly has microwave structures and a flexible ground plane. The socket assembly further includes an elastomeric spacer adjacent the leadframe assembly, the elastomeric spacer having one or more holes receiving the spring probes therethrough.