Wafer Bonding via Plasma-Activated Reservoirs

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Solution Overview

Problem

Current methods for bonding substrates often result in non-reproducible results and require high temperatures, leading to energy consumption and potential damage to structures, while also failing to ensure compatibility with electrically active components and maintaining mechanical resilience.

Innovation Solution

A method involving the creation of a reservoir on one substrate for a first educt, which reacts with a second educt to form a permanent bond, using a reaction layer to enhance bonding strength and speed, with processes that minimize temperature and mechanical stress, such as plasma activation and the use of thin reaction layers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Strength

If high temperatures (>400°C) are used for bonding substrates, then bond strength and repeatability are improved, but energy consumption increases and structures on substrates may be damaged

Engineering Contradiction:
Improvebond strengthVSAvoidenergy consumption
Core Design Contradiction:
StrengthVSUse of energy by moving object

Solution Approach 1:

The substrates are pre-treated with plasma activation before bonding to create hydrophilic surfaces with increased surface energy. This preliminary action enables strong bonding at lower temperatures by ensuring optimal surface conditions for adhesion, eliminating the need for high-temperature processing while maintaining bond strength and reducing energy consumption

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The invention changes the bonding parameters from high temperature (>400°C) to low temperature (room temperature or slightly elevated). By combining plasma activation with controlled humidity and temperature conditions, the method achieves strong, reproducible bonds without the energy consumption and structural damage associated with high-temperature processes

Inventive Principle:
Principle #35Parameter changes

2Strength

If high temperatures (>400°C) are used for bonding substrates, then bond strength and repeatability are improved, but structures on substrates may be damaged

Engineering Contradiction:
Improvebond strengthVSAvoiddamage to structures
Core Design Contradiction:
StrengthVSObject-affected harmful factors

Solution Approach 1:

Plasma activation is performed as a preliminary step to prepare the substrate surfaces for bonding. This creates hydrophilic surfaces with optimized surface energy, enabling strong bonds to form at low temperatures without exposing temperature-sensitive structures to damaging high temperatures

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The bonding process parameters are changed from high temperature to low temperature operation. This parameter change eliminates thermal damage to sensitive structures while maintaining strong bond strength through plasma-activated surface preparation and controlled environmental conditions

Inventive Principle:
Principle #35Parameter changes

3Reliability

If high temperatures are used for bonding, then repeatability is improved, but compatibility with electrically active components is reduced

Engineering Contradiction:
ImproverepeatabilityVSAvoidcompatibility with active components
Core Design Contradiction:
ReliabilityVSAdaptability or versatility

Solution Approach 1:

Plasma activation provides a preliminary preparation step that creates consistent, hydrophilic surfaces with controlled surface energy. This ensures repeatable bonding results while maintaining low temperatures that are compatible with existing electronic components and structures on the substrates

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The bonding process operates at low temperatures compatible with electronic components, while repeatability is achieved through plasma activation and controlled environmental parameters (humidity, temperature). This parameter change enables both component compatibility and process repeatability

Inventive Principle:
Principle #35Parameter changes

4Temperature

If bonding force is reduced to lower temperature, then mechanical resilience is improved, but bond strength may be compromised

Engineering Contradiction:
Improvebonding temperatureVSAvoidbond strength
Core Design Contradiction:
TemperatureVSStrength

Solution Approach 1:

Plasma activation is performed as a preliminary step to maximize surface energy and create hydrophilic surfaces. This preparation enables strong bonds to form at low temperatures by ensuring optimal surface conditions for adhesion, compensating for the reduced thermal energy available for bonding

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The method changes from temperature-driven bonding to surface-energy-driven bonding. By controlling surface energy through plasma activation and environmental parameters (humidity, temperature), strong bonds are achieved at low temperatures without compromising bond strength

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach achieves a strong, reproducible permanent bond at lower temperatures, reducing mechanical stress and energy consumption, while maintaining compatibility with active components and improving bond strength by minimizing gaps between substrates.

Implementation Method 1

at least one of the contact surfaces (3, 4) is subjected to a plasma treatment in order to activate the contact surfaces (3, 4) and, in particular, to create a reservoir (5)

Methodology Applied
Scientific EffectPlasma activation: Plasma

Implementation Method 2

Water molecules diffuse from the reservoir (5) into a reaction layer (7, 7'), in particular into silicon (Si), with the formation of silicon dioxide (SiO2)

Methodology Applied
Scientific EffectDiffusion: Diffusion

Implementation Method 3

water molecules diffuse from the reservoir (5) into a reaction layer (7, 7'), in particular into silicon (Si), with the formation of silicon dioxide (SiO2)

Methodology Applied
Scientific EffectOxidation: Oxidation

Data Source

PatentEP2695182B1Method for permanently bonding wafers
Publication Date: 2016.03.30 EV GRP E THALLNER GMBH
  • EP2695182B1 patent drawingFigure 1a~2b
  • EP2695182B1 patent drawingFigure 3~6
  • EP2695182B1 patent drawingFigure 7

AI summary

The invention relates to a method for bonding a first contact surface (3) of a first substrate (1) to a second contact surface (4) of a second substrate (2), having the following steps, in particular in the following sequence: - forming at least one reservoir (5, 5') in at least one reservoir-forming layer (6, 6') on the first substrate (1) and/or on the second substrate (2), said reservoir (5, 5') consisting at least predominantly of an amorphous material, - at least partly filling the reservoir(s) (5, 5') with a first reactant or a first group of reactants, - forming or applying a reaction layer (17) that contains a second reactant or a second group of reactants onto the reservoir (5) and/or the reservoir (5'), - contacting the first contact surface (3) with the second contact surface (4) in order to form a pre-bonding connection, and - forming a permanent bond between the first and second contact surfaces (3, 4), said bond being at least partially reinforced by reacting the first reactant or the first group with the second reactant or the second group.