Wafer Carrier With Plasma Separation Layer

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional methods for thinning and processing wafers face challenges due to mechanical and thermal stresses, particularly when dealing with three-dimensionally structured surfaces, leading to issues with adhesion and separation of carrier layers, which can result in wafer breakage and inefficiencies in thinning and dicing processes.

Innovation Solution

A wafer carrier arrangement featuring a carrier layer system comprising a cured, partially cured, or curable elastomeric material and a plasma polymeric separating layer, where the adhesive strength between the carrier layer and the separating layer is greater than that between the wafer and the release liner, allowing for controlled separation and reduced mechanical stress during thinning and processing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Length of moving object

If the wafer is severely thinned to reduce original thickness, then the desired thin electronic components are achieved, but the risk of wafer breaking increases due to mechanical and thermal loads

Engineering Contradiction:
Improvewafer thicknessVSAvoidwafer breakage risk
Core Design Contradiction:
Length of moving objectVSReliability

Solution Approach 1:

A plasma polymeric separating layer is introduced as an intermediary between the wafer and the carrier layer. This separating layer has controlled adhesion properties that allow it to detach easily from the wafer after processing, thereby reducing mechanical stress and breakage risk during handling and separation operations

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The adhesion strength of the plasma polymeric separating layer is optimized by adjusting plasma polymerization parameters (power, pressure, gas composition, treatment time) to achieve the right balance between sufficient attachment during processing and easy detachment afterward, minimizing wafer stress throughout the process

Inventive Principle:
Principle #35Parameter changes

2Ease of operation

If a plasma polymeric separating layer is used to reduce adhesion issues, then separation becomes easier, but the adhesion to the carrier layer must be sufficiently strong to prevent detachment during processing

Engineering Contradiction:
Improveseparation easeVSAvoidadhesion to carrier layer
Core Design Contradiction:
Ease of operationVSStrength

Solution Approach 1:

The plasma polymeric separating layer exhibits different adhesion characteristics at different interfaces: weak adhesion to the wafer surface for easy separation, and strong adhesion to the carrier layer for stable attachment during processing. This spatial variation in adhesion quality resolves the contradiction between easy separation and processing stability

Inventive Principle:
Principle #3Local quality

3Strength

If conventional carrier layers are used, then structural support is provided, but they cannot adapt to three-dimensionally structured wafer surfaces, leading to adhesion failures

Engineering Contradiction:
Improvestructural supportVSAvoidsurface adaptation
Core Design Contradiction:
StrengthVSAdaptability or versatility

Solution Approach 1:

The plasma polymeric separating layer forms a flexible conformal coating that adapts to three-dimensionally structured wafer surfaces including bumps and trenches. This flexible thin film maintains intimate contact with complex surface geometries, ensuring uniform plasma treatment and stable carrier attachment across the entire wafer surface

Inventive Principle:
Principle #30Flexible shells and thin films

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enables easier handling and stabilization of wafers during processing, allowing for more extensive thinning while minimizing mechanical stress and preventing wafer breakage, especially on complex surfaces, and facilitates efficient separation and further processing of wafers.

Implementation Method 1

the plasma polymeric separating layer (4) and a layer (5) of a cured, partially cured or curable elastomeric material, wherein the adhesive strength between the carrier layer system (6, 5) and the separating layer (4)

Methodology Applied
Scientific EffectAdhesion: Adhesive

Data Source

PatentEP1994554B1Method for processing, in particular, thin rear sides of a wafer, wafer-carrier arrangement and method for producing said type of wafer-carrier arrangement
Publication Date: 2015.07.29 THIN MATERIALS
  • EP1994554B1 patent drawingFigure 1
  • EP1994554B1 patent drawingFigure 2
  • EP1994554B1 patent drawingFigure 3

AI summary

The invention relates to a wafer-carrier arrangment comprising a wafer (1), a carrier layer system (5, 6) and a separation layer (4) which is arranged between the carrier layer system (5, 6) and the wafer (1). The carrier layer system (5, 6) comprises: i) a carrier layer (6) and ii) a layer made of a hardened, partially hardenend of hardenable elastomer material on the separating layer side, or comprises both layers. The separation layer (4) is: iii) a plasma polymer layer and iv) the adhesive strength between the carrier layer system (5, 6) and the separating layer (4), according to hardening of the elastomer material, is greater than the adhesive strength between the wafer (1) and the separating layer (4).