Wafer Chamber Position Sensing Without Opening the Chamber

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Solution Overview

Problem

Existing wafer processing systems face challenges in maintaining consistent temperature within the chamber, leading to prolonged recovery times when heat is lost, and require methods to detect internal chamber positions without opening the chamber.

Innovation Solution

An apparatus with a body frame containing sensors and indicating parts, powered by a unit, is mounted on a robot arm's end effector to detect and indicate object positions within the chamber, using optical or mechanical sensors and LEDs, with optional sealing and computing capabilities to automate detection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of information

If the chamber is opened to check internal positions, then visibility of internal objects is improved, but temperature stability deteriorates and recovery time increases

Engineering Contradiction:
Improvevisibility of internal objectsVSAvoidtemperature recovery time
Core Design Contradiction:
Loss of informationVSLoss of time

Solution Approach 1:

The patent replaces mechanical visual inspection (opening the chamber) with an optical sensing system. Sensors mounted on the robot arm's end effector detect object positions through the chamber window or opening without requiring the chamber to be opened, substituting mechanical observation with optical detection to maintain temperature stability while obtaining position information

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent introduces sensors as an intermediary between the observer and the objects inside the chamber. These sensors act as mediators that can detect object positions through the chamber boundary without requiring direct visual access by opening the chamber, thus preserving the thermal environment while providing position information

Inventive Principle:
Principle #24Intermediary (Mediator)

2Difficulty of detecting and measuring

If sensors are exposed to chamber environment for detection, then detection capability is improved, but sensor reliability deteriorates due to harsh environment

Engineering Contradiction:
Improvedetection capabilityVSAvoidsensor reliability
Core Design Contradiction:
Difficulty of detecting and measuringVSReliability

Solution Approach 1:

The patent divides the sensing system into separate functional components: sensors mounted on the end effector body, individual sealing lids for each sensor, and signal transmission pathways. This segmentation allows each sensor to be independently protected by its own sealing lid while maintaining detection capability, isolating the sensors from the harsh chamber environment (high temperature, plasma, vacuum) to ensure reliability

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent uses sealing lids (which may be made of heat-resistant or transparent materials) to protect sensors from the chamber environment. These sealing structures act as protective barriers that allow optical or mechanical sensing to function while shielding the sensors from high temperature, plasma exposure, and vacuum conditions that would otherwise damage them

Inventive Principle:
Principle #30Flexible shells and thin films

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Facilitates real-time detection of internal chamber positions, reducing the need for temperature recovery time and enabling efficient operation without opening the chamber.

Implementation Method 1

the sensing part comprises a plurality of sensors for sensing positions of objects in a chamber... wherein the plurality of sensors is one of the optical sensor or mechanical push switch

Methodology Applied
Scientific EffectOptical detection: Reflection

Implementation Method 2

the indicating part comprises a plurality of signals for indicating detection of the objects... wherein the plurality of signals is LED

Methodology Applied
Scientific EffectLight-emitting diode effect: Light Emitting Diode

Data Source

PatentUS20250308961A1Apparatus for detecting internal positions of a chamber in a wafer processing system
Publication Date: 2025.10.02 ASM IP HLDG BV
  • US20250308961A1 patent drawing
  • US20250308961A1 patent drawing
  • US20250308961A1 patent drawing

AI summary

An object detection apparatus used to detect objects in a chamber of a wafer processing system is presented. The apparatus for detecting object positions in a chamber of a wafer processing system comprises: a body frame comprising a sensing part and an indicating part, wherein the sensing part comprises at least one sensor for sensing positions of objects in a chamber and the indicating part comprises at least one signal for indicating detection of the objects, wherein each of the at least one sensor correspond to each of the at least one signal, and a power unit disposed in the body frame and configured to supply power to the at least one signal. With this apparatus, work such as teaching can be done without opening the chamber or lowering the temperature of the chamber so it is possible to significantly shorten the work time and save energy.