Wafer Chuck Thermal Tuning Cavities for Uniform Wafer Temperature

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Solution Overview

Problem

Semiconductor processing chucks exhibit noticeable azimuthal non-uniformity in temperature, leading to non-uniformity in wafer thickness, despite careful design efforts to minimize material discontinuities.

Innovation Solution

Incorporation of thermal tuning cavity features in the chuck material to actively manage heat flow, reducing heat transfer efficiency in specific regions and enhancing temperature uniformity across the wafer support surface.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Temperature

If conventional chuck designs with heat exchange passages are used, then active temperature control is achieved, but azimuthal temperature non-uniformity persists

Engineering Contradiction:
Improvetemperature uniformityVSAvoidchuck structure complexity
Core Design Contradiction:
TemperatureVSDevice complexity

Solution Approach 1:

The patent applies local quality by introducing thermal tuning cavity features at specific locations within the chuck baseplate where temperature non-uniformity occurs. These cavities are strategically positioned to modify heat flow paths in cooler regions, creating localized thermal adjustments that enhance overall temperature uniformity without requiring complex multi-zone heating systems.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent converts the harmful effect of material discontinuities (which cause temperature non-uniformity) into a beneficial feature by deliberately introducing thermal tuning cavities. These cavities exploit the disruption of heat flow paths to retain heat in cooler regions, transforming what would normally be thermal defects into useful thermal tuning mechanisms that achieve uniform temperature distribution.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

2Temperature

If thermal tuning cavity features are added to modify heat flow, then temperature uniformity is enhanced, but chuck manufacturing complexity increases

Engineering Contradiction:
Improvetemperature uniformityVSAvoidchuck manufacturing ease
Core Design Contradiction:
TemperatureVSEase of manufacture

Solution Approach 1:

The patent merges the thermal tuning function with existing chuck structural features by integrating cavities into the baseplate design. These cavities are combined with the heat exchange passages and support structure, allowing multiple functions (structural support, heat exchange, and thermal tuning) to be achieved through a unified design rather than separate components.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent employs parameter changes by modifying the geometric parameters of the baseplate (introducing cavities with specific dimensions, shapes, and positions) to alter heat flow characteristics. By adjusting cavity parameters such as volume, depth, and location, the thermal performance is optimized to achieve uniform temperature distribution while maintaining manufacturability through controlled variations in baseplate geometry.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Achieves exceptionally uniform temperature distributions with minimal variation, comparable to complex multi-zone heating systems, while maintaining stability and reducing susceptibility to failure.

Implementation Method 1

thermal tuning cavity features...serve no other purpose except to passively modify heat flow within the chuck

Methodology Applied
Scientific EffectHeat conduction: Conduction (thermal)

Implementation Method 2

one or more heat exchange passages that may be used to heat and/or cool the chuck, depending on the circumstances, by flowing heated or cooled liquids

Methodology Applied
Scientific EffectHeat exchange: Heat Exchanger

Data Source

PatentUS12604703B2Wafer chuck with thermal tuning cavity features
Publication Date: 2026.04.14 LAM RES CORP
  • US12604703B2 patent drawing
  • US12604703B2 patent drawing
  • US12604703B2 patent drawing

AI summary

Wafer chucks or baseplates therefor are disclosed that feature thermal tuning cavity features that are positioned and sized so as to provide a more uniform temperature distribution across a wafer support surface of such a wafer chuck. Each thermal tuning cavity feature may be positioned adjacent to a portion or portions of a heat exchange passage or passages within a baseplate of the wafer chuck. By locating thermal tuning cavity features in locations underneath where the wafer support surface of the wafer chuck would otherwise demonstrate localized regions of lower temperature (as compared with adjacent regions of the wafer chuck support surface), the lower-temperature regions may be caused to have elevated temperatures that more closely match the surrounding temperatures, thereby increasing temperature uniformity.