Single-Wafer Cleaning Ionizer for Electrostatic Charge Neutralization

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Solution Overview

Problem

The miniaturization of patterns on semiconductor wafers has increased the importance of the cleaning process, where electrostatic charges can damage circuits and films during wafer cleaning, leading to defects.

Innovation Solution

A single-wafer-type cleaning apparatus equipped with an ionizer that generates ions using methods like corona, piezo high frequency alternating current, or X-ray to neutralize charged particles on the wafer, combined with a chuck system and chemical dispensing nozzles for effective cleaning and drying.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If the cleaning process is performed to remove residues and contaminants from the wafer surface, then cleaning effectiveness is improved, but electrostatic charges can accumulate and damage circuits and films

Engineering Contradiction:
Improvecleaning effectivenessVSAvoidelectrostatic charge damage
Core Design Contradiction:
Manufacturing precisionVSObject-affected harmful factors

Solution Approach 1:

The ionizer is positioned to emit ions onto the wafer surface before the cleaning chemicals are applied and before the wafer is removed from the cleaning apparatus. This preliminary neutralization of electrostatic charges prevents the accumulation of harmful charges that would otherwise damage circuits and films during the cleaning process, while still allowing effective cleaning to occur.

Inventive Principle:
Principle #9Preliminary anti-action

2Productivity

If the wafer is rotated at high speed for effective cleaning, then cleaning efficiency is improved, but electrostatic charges are generated and accumulated

Engineering Contradiction:
Improvecleaning efficiencyVSAvoidelectrostatic charge accumulation
Core Design Contradiction:
ProductivityVSObject-generated harmful factors

Solution Approach 1:

The ionizer converts the electrostatic charges that are generated during high-speed wafer rotation into a beneficial effect by emitting ions that neutralize these charges. The harmful electrostatic accumulation is transformed into a controlled ion emission process that prevents damage while maintaining the high-speed rotation necessary for effective cleaning.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Solution Approach 2:

The ionizer acts as an intermediary between the rotating wafer and the cleaning chemicals. It neutralizes electrostatic charges on the wafer surface, preventing charge accumulation that would otherwise interfere with the cleaning process and potentially damage the wafer. This intermediary function allows high-speed rotation to proceed without generating harmful electrostatic effects.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Reliability

If an ionizer is added to neutralize electrostatic charges, then defect reduction is improved, but device complexity increases

Engineering Contradiction:
Improvedefect rateVSAvoidapparatus structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The ionizer is integrated into the existing cleaning apparatus structure, allowing it to perform multiple functions: neutralizing electrostatic charges on the wafer surface, working in conjunction with the cleaning chemicals, and operating during the high-speed rotation process. This multi-functionality reduces the need for separate dedicated systems while achieving defect reduction.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The apparatus effectively neutralizes electrostatic charges on the wafer, reducing defect rates and ensuring the integrity of semiconductor devices during the manufacturing process.

Implementation Method 1

the ionizer may generate the ions using a corona method

Methodology Applied
Scientific EffectCorona discharge: Corona Discharge

Implementation Method 2

the ionizer may generate the ions using a corona method, a piezo high frequency alternating current (HF-AC) method

Methodology Applied
Scientific EffectPiezoelectric effect: Piezoelectric Effect

Implementation Method 3

the ionizer may generate the ions using a corona method, a piezo high frequency alternating current (HF-AC) method, or an X-ray method

Methodology Applied
Scientific EffectX-ray ionization: X-Ray

Implementation Method 4

the chuck may include a non-rotating body disposed at a center of the chuck and a rotating body configured to surround the non-rotating body

Methodology Applied
Scientific EffectCentrifugal force: Centrifugal Force

Data Source

PatentUS9887078B2Single-wafer-type cleaning apparatus
Publication Date: 2018.02.06 SAMSUNG ELECTRONICS CO LTD
  • US9887078B2 patent drawing
  • US9887078B2 patent drawing
  • US9887078B2 patent drawing

AI summary

A single-wafer-type cleaning apparatus is provided. The single-wafer-type cleaning apparatus is configured to be capable of controlling electrostatic charges generated due to rotating a wafer during a semiconductor cleaning process and a defect caused by the electrostatic charges. The cleaning process uses an ionizer mounted on a chuck.