Wafer Coating System Using Tilting Pin for Uniform Epoxy Isolation
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Solution Overview
Problem
The challenge in semiconductor chip packaging lies in forming a uniform isolation layer, as traditional oxide materials are expensive and time-consuming to deposit, while epoxy materials used as alternatives are prone to aggregation due to gravity, leading to non-uniform layers and reduced yield.
Innovation Solution
A wafer coating system that includes a wafer chuck, a flowing insulating material sprayer, and a tilting lifting pin to form an acute angle between the wafer and gravity, ensuring uniform distribution of photosensitive epoxy material, which is then cured to create a consistent isolation layer.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If oxide material is used to prepare isolation layer, then insulating property is improved, but manufacturing cost increases and process time extends
Solution Approach 1:
The patent replaces expensive oxide materials with epoxy material that can be applied as a disposable coating layer. The epoxy material achieves sufficient insulating properties for chip packaging without requiring complex deposition processes, thereby reducing both material cost and process time while maintaining functional requirements.
Solution Approach 2:
The patent substitutes complex oxide deposition processes with a simpler epoxy coating and curing process. Instead of using sophisticated physical vapor deposition or chemical vapor deposition equipment to deposit oxide layers, the invention uses straightforward epoxy application followed by UV curing, dramatically simplifying the manufacturing system.
2Productivity
If epoxy material is used to prepare isolation layer, then process efficiency is improved, but uniformity of isolation layer deteriorates due to material aggregation
Solution Approach 1:
The patent introduces a wafer tilting mechanism that dynamically adjusts the wafer orientation during epoxy coating. By tilting the wafer at a specific angle (e.g., 5-15 degrees), gravity is utilized to promote uniform epoxy flow across the wafer surface and into through-holes, preventing aggregation and ensuring consistent coating thickness throughout the packaging structure.
Solution Approach 2:
The patent changes the physical parameters of the coating process by controlling wafer tilt angle, epoxy viscosity, and curing conditions. By optimizing these parameters, the epoxy material flows uniformly during application and maintains consistent thickness, achieving both high productivity and manufacturing precision.
3Ease of manufacture
If epoxy material is applied horizontally, then application process is simplified, but material aggregation occurs due to gravity, reducing chip package yield
Solution Approach 1:
The patent employs a dynamic tilting mechanism that adjusts wafer orientation during the epoxy application process. By tilting the wafer at a controlled angle, the system maintains simplicity in the application process while using gravity to guide epoxy flow into through-holes and across the surface, preventing aggregation and ensuring uniform coverage that maintains high chip package yield.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method effectively prevents aggregation of the insulating material, maintains excellent insulating properties, and increases the yield of chip packages by ensuring uniform thickness across the wafer surfaces and through holes, reducing the risk of undercut profiles and disconnection of conductive layers.
Implementation Method 1
the wafer tilting lifting pin is configured to form a first acute angle between the wafer and direction of gravity
Implementation Method 2
the flowing insulating material is a photosensitive epoxy
Data Source
AI summary
A wafer coating system includes a wafer chuck, a flowing insulating material sprayer and a wafer tilting lifting pin. The wafer chuck has a carrier part and a rotating part, which the carrier part is mounted on the rotating part to carry a wafer, and the rotating part is configured to rotate with a predetermined axis. The flowing insulating material sprayer is above the wafer chuck and configured to spray a flowing insulating material to the wafer, and the wafer tilting lifting pin is configured to form a first acute angle between the wafer and direction of gravity.


